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姓名 劉名夏(Ming-Shia Liu) 查詢紙本館藏 畢業系所 工業管理研究所 論文名稱 在半導體晶圓製程裡的最佳等候時間門檻
(Optimal Waiting Time Thresholds In Semiconductor Wafer Fabrication)相關論文 檔案 [Endnote RIS 格式] [Bibtex 格式] [相關文章] [文章引用] [完整記錄] [館藏目錄] [檢視] [下載]
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摘要(中) 由於半導體公司的利潤被壓縮,半導體公司開始使用各種方法來增加公司的生產利潤。有些公司開始使用控制物料等候時間門檻的方法來增加生產利潤,這個方法就是對物料的等候時間設定一個限制門檻,如果物料在等候線上的時間超過這個門檻,就報廢或是用其他的方式處理。這個方法可以增加製造完成品的成功率,而且也可以節省等候線上的空間。
本論文研究用M/G/1等候系統去建立一個利潤模型,然後用三個策略去分析;控制物料到達率策略、先進先出的等候時間門檻策略、後進先出的等候時間門檻策略。首先我們分析控制物料到達率對系統的影響和極大單位時間利潤,然後發展此模型到物料先進先出和後進先出的情況下求最佳的等候時間門檻使單位時間利潤極大化。最後再進一步比較物料先進先出的等候時間門檻策略和物料後進先出的等候時間門檻策略的不同。摘要(英) Semiconductor companies use many kinds of methods to administrate their yield profit. Some semiconductor companies have used a method of controlling waiting time thresholds in the queue already. They use a threshold policy to limit the waiting time materials spend in the queue. If a material spends the time over the time thres- hold, the material will be discarded. It is in order to decrease the defective materials are processed by the machine and increase some useful space in the queue.
In this thesis, we develop a profit model as an M/G/1 queuing system. Three policies are used in our thesis: arrival rate control policy, waiting time threshold policy with first-come-first-serve, waiting time threshold policy with last-come -first-serve. We control the arrival rate of materials to maximize the profit earned per unit time and analysis its effect. Then, we use waiting time threshold policy with first- come-first-serve and waiting time threshold policy with last-come-first-serve to find the optimal waiting time threshold and find the optimal profit earned per unit time. Finally, the comparison of two threshold policies is showed.關鍵字(中) ★ 半導體
★ 等候時間
★ 等候線
★ 到達率
★ 先進先出
★ 後進先出關鍵字(英) ★ semiconductor
★ waiting time
★ queue
★ first-come-first -serve
★ arrival rate
★ last-come-first-serve論文目次 Table of Contents i
List of Figures iv
List of Tables v
CHAPTER I INTRODUCTION 1
1.1 Background and Motivation 1
1.3 Framework 3
CHAPTER II LITERATURE REVIEW 5
2.1 Yield Systems 5
2.2 Yield of Waiting Time Threshold 6
CHAPTER III YIELD MODELS 9
3.1 Throughput Rate 9
3.2 Unit-Time Profit 12
3.3 Waiting Time Threshold 13
3.3.1 Waiting Time Threshold Policy with First-Come-First-Serve 14
3.3.2 Waiting Time Threshold Policy with Last-Come-First-Serve 19
CHAPTER IV NUMERICAL ANALYSIS 25
4.1 Optimal Throughput Rate 25
4.2 Arrival Rate Control Policy 26
4.2.1 Analysis of Arrival Rate Control 27
4.3 Unit-Time Profit of Waiting Time Threshold Policy with FCFS 30
4.4 Algorithm for Waiting Time Policy with LCFS 31
4.5 Effect of the Wafer’s Cost on Waiting Time Threshold Policies 32
4.6 Comparison of Waiting Time Threshold Policy with FCFS and LCFS 34
CHAPTER V SUMMARY CONCLUSIONS AND FUTURE RESEARCH 38
5.1 Conclusion 38
5.2 Future Study 39
References 40
Appendix 42參考文獻 [1] Abate, J. and Whitt, W.,”Numerical Inversion of Laplace Transforms of Probabil- ity Distributions,”ORSA Journal on Computing,Vol. 7,No. 1, 1995.
[2] Burden, R. L. Faires, J.D.,”Numerical Analysis”BROOKS/COLE,2001.
[3] Baccelli, F.,Boyer, P.and Hebuterne, G. ”Single-Server Queues with Impatient Customers,”Adv.Appl.Prob., 16, 1984, pp. 887-904.
[4] Barrer,D.Y .,”Queuing with Impatient Customers and Ordered Service,”Operatio- ns Res., 5, 1957, pp. 650-657
[5] Chen, H., Harrison, J.M.,Mandelbaum,A.,Ackere,A.V., and Wein, L.M.”Empirical of a Queueing Network Model for Semiconductor Wafer Fabrication,”Operations Res., vol. 36. no. 2, Mar.-Apr. 1988,pp.202-215.
[6] Cunningham,J.A., “The use and evaluation of yield models in integrated circuit manufacturing,”IEEE Trans.Semicond. Manufact.,vol. 2, Aug., pp. 60-71. 1990.
[7] Daley, D.J. “General Customer Impatience in the Queue GI/G/1,”J. Appl. Prob., 2, 1965, pp. 186-205.
[8] Haugen, R. B., and Skogan, E.,“Queuing Systems with Stochastic Time Out,”IEE- E Transactions on Communication, 28, 12, 1980, pp. 1984-1989.
[9] Holl, D.L.,Maple,C.G.,Vinograde, B. Introduction to the Laplace Transform,New York:Applection,1959.
[10] Kleinrock, L., Queueing Systems, Volume I:Theory. New York:Wiley, 1975.
[11] Osburn,C.M.,and Donovan,R.P.,”The Effects of Contamination on Semiconduct- or Manufacturing Yield,”The Journal of Environmental Sciences, Mar./Apr. 1988, pp. 45-57.
[12] Rao, S.S., “Queuing with Balking and Reneging in M/G/1 Systems,”Metrika, 12, 1968, pp. 173-188.
[13] Uzsoy,U., Lee,C.Y., and Martin-Vega, L.A., ”A Review of Production Planning and Scheduling Models in The Semiconductor Industry Part I:System Charact- eristic, Performance Evaluation and Production Planning,”IIE Transactions, Vol. 24, No. 4, 1992, pp. 47-60.
[14] Wein,L., “On the Relationship between Yield and Cycle Time in Semiconductor Wafer Fabrication,”IEEE Trans. Semicond.Manufact., Vol.5, No. 2, 1992, PP. 156-158.
[15] Wood,S.C., “Cost and Cycle Time Performance of Fabs Based on Integrated Single-Wafer Processing,”IEEE Trans. Semicond. Manufact., Vol. 10, no. 1, 1997, pp. 98-111.
[16] Prayoon, Patana-anake.”Two Problems In The Optimal Control of Stochastic Manufacturing Systems.” Ph.D Dissertation. Department of Industrial and Operation. , University of Michigan, MI, U.S.A. 2000.指導教授 葉英傑(Yingchieh Yeh) 審核日期 2006-12-16 推文 facebook plurk twitter funp google live udn HD myshare reddit netvibes friend youpush delicious baidu 網路書籤 Google bookmarks del.icio.us hemidemi myshare