參考文獻 |
[1] Casimiro de Almeida Barreto, Joao Antonio Zuffo, and Sergio Takeo Kofuji, “ Automated Optical Inspection System for Professional Double Face Printed Circuit Boards”, Proceedings of the IEEE International Symposium on Industrial Electronics, ISIE '97. , pp 65-71, vol. 1 , 1997.
[2] Ji-joong Hong, Kyung-ja Park, and Kyung-gu-Kim, “Parallel Processing Machine Vision System for Bare PCB Inspection”, Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society, 1998. IECON '98., pp 1346-1350, vol. 3 , 1998
[3] Masayasu Ito, Isao Fujita, Yoshinori Takeuchi, and Tooru Uchida, “Pattern Defect Analysis and Evaluation of Printed Circuit Boards Using CAD Data”, IEEE/CHMT Int’l Electronics Manufacturing Technology Symposium, pp 7-10, 1993.
[4] Horng-Hai Loh, and Ming-Sing Lu, “Printed Circuit Board Inspection Using Image Analysis”, IEEE Trans. on Industry Applications, pp 426-432, vol. 35, no. 2, March/April 1999.
[5] Toshinobu Kishi, Tatsunori Hibara, and Nobuhiko Nakano, “CPT Inspection Systems withImage Processing”, Proceedings of the IECON '93. International Conference on Industrial Electronics, Control, and Instrumentation, pp 1893-1897, 1993.
[6] Michael Recce, John Taylor, Alessio Plebe, and Giuseppe Tropiano, “High Speed Vision-Based Quality Grading of Oranges”, Proceedings of International Workshop on Neural Networks for Identification, Control, Robotics, and Signal/Image Processing, pp 136 —144, 1996
[7] Julius T. Tou and Rafael C. Gonzalez, “Pattern Recognition Principles”, Addision-Wesley Publishing Company, pp173-181, 1974.
[8] Joseph W. Goodman, “Introduction to Fourier Optics Second Edition”, McGraw-Hill.
[9] Rafael C. Gonzalez and Richard E. Woods, “Digital Image Processing”, Addison-Wesley, 1992.
[10] Hakulinen, A. and Hakkarainen, J., “A Neural Network Approach to Quality Control of Padlock Manufacturing”, Pattern Recognition Letters, pp. 357-362, vol. 17, 1996.
[11] Dorrity, J.L. and Vachtsevanos, G., “On-line defect detection for weaving systems”, IEEE 1996 Annual on Textile, Fiber and Film Industry Technical Conference, pp. 1-6, 1996.
[12] Sugimoto, T. and Kawaguchi, T., “Development of a surface defect inspection system using radiant light from steel products in a hot rolling line”, IEEE Transactions on Instrumentation and Measurement, pp. 409-416, vol. 47, Issue 2, April 1998.
[13] Malave, C.O., Cecil, J.A., Hernandez, W., “An integrated methodology for electronic assembly planning”, Electronics Manufacturing Technology Symposium, Eleventh IEEE/CHMT International, pp.218 —221, 1991.
[14] E.R.Davies, “Machine Vision”, Academic Press, pp.79-101, 1997.
[15] Ramesh Jain, Rangachar Kasturi, Brain G. Schunck, “Machine Vision”, McGraw-Hill, pp73-86,1995
[16] Dana H. Ballard and Christopher M. Brown, “Computer Vision”, Prentice-Hall, pp65-70, pp106-111, 1982
[17] Matrox Electronic, “Matrox Imaging Library User Guide”, Matrox Electronic, pp171-207, March 2000.
[18] Shaogang Gong, Stephen J McKenna, and Alexandra Psarrou, “Dynamic Vision”, Imperial College Press, pp113-122, 2000 |