參考文獻 |
[AND] I. E. Anderson and J. L. Harringa, “Suppression of void coalescence in thermal aging of Tin-Silver-Copper-X solder joints,” J. Electron. Mater., 35, p.94, 2006.
[CHI] T. C. Chiu, K. Zeng, R. Stierman, D. Edwards, and K. Ano, “Effect of thermal aging on Board Level Drop Reliability for Pb-free BGA Packages,” Proceeding of 2004 Electronic Component and Technology Conference, pp. 1256-1262.
[CHO] M. G. Cho, S. K. Kang, D. Y. Shih, and H. M. Lee, IBM Research Report, RC24192, 2007.
[CHO2] C. Y. Chou and S. W. Chen, Acta Mater., 54, p.2393, 2006.
[HAY] A. Hayashi, C. R. Kao, and Y. A. Chang, Scripta Mater., 37, p.393, 1997.
[HO1] C. E. Ho, Y. L. Lin, and C. R. Kao, Chem. Mater., 14, p.949, 2002.
[HO2] C. E. Ho, R. Y, Tsai, Y. L. Lin, and C. R. Kao, J. Electron. Mater., 31, p.584, 2002.
[HO3] C. E. Ho, Y. W. Lin, S. C. Yang, C. R. Kao, and D. S. Jiang, J. Electron, Mater., 35, p.1017, 2006.
[HUA] C. W. Huang and K. L. Lin, Mater. Trans., 2004, v.45(2), p.588-594.
[HUA2] C. W. Huang and K. L. Lin, J. Mater. Res., 19, p.3560, 2004.
[IPC] IPC Roadmap for Lead-Free Electronics Assemblies, 2nd draft, IPC, Northbrook, IL, November, 1999.
[JAN] J. W. Jang, L. N. Ramanathan, J. K. Lin, and D. R. Frear, J. Appl. Phys., 95, p.8286, 2004.
[KAN1] S. K. Kang, D. Y. Shih, D. Leonard, D. W. Henderson, T. Gosselin, S. Cho, J. Yu, and W. K. Choi, JOM, 56, p.34, 2004.
[KAN2] S. K. Kang, D. Leonard, D.-Y. Shih, L. Gignac, D. W. Henderson, S.-I Cho, and J. Yu, J. Electron. Mater., 35, p.479, 2006.
[KAY] P. J. Kay and C. A. Machkay, Trans. Inst. Metal Finish., 54, p.68, 1976.
[LAU] J. H. Lau, “Low Cost Flip Chip Technologies for DCA, WLCSP, and PBGA Assemblies”, McGraw-Hill, (2000).
[LAU2] T. Laurila, V. Vuorinen, and J. K. Kivilahti, Mater. Sci. Eng., R49, p.1, 2005.
[LEE] H. M. Lee, S. W. Yoon, and B. J. Lee, J. Electron. Mater., 27, p.1161, 1998.
[LOO] M. E. Loomans, S. Vaynman, G. Ghosh and M. E. Fine , J. Electronic Mater., 1994, v.23, p.741-746.
[MCC] M. McCormack, S. Jin, G. W. Kammlott, and H. S. Chen, Appl. Phys. Lett., 63, p.15, 1993.
[NEMI] National Electronics Manufacturing Initiative(NEMI) Lead-Free Readiness Task Force Report, NEMI, 1999.
[ONI] M. Onishi and H. Fujibuchi, T. Jpn. I. Met., 16, p.539, 1975.
[PCIF] Printed Circuits Federation / International Tin Research Institute Joint Statement, PCIF/ ITRI, 1999.
[SHA] Andrew A. Shapir, J. Kirk. Borne, Oladele A. Ogunseitan, Jean-Daniel M. Saphores,Julie M. Schoenung, 2004 IEEE Aerospace Conference Proceedings, p. 2474.
[SPE] P. J. Spencer, Calphad: Computer Coupling of Phase Diagrams and Thermochemistry. Vol. 10, p. 175. 1986.
[SUG] K. Suganuma, K. Niihara, T. Shoutoku and Y. Nakamura, J. Mater. Res., 13, p.1859, 1998.
[TU1] K. N. Tu, Acta Metall., 21, p.347, 1973.
[TU2] K. N. Tu and R. D. Thompson, Acta Metall., 30, p.947, 1982.
D. S. Dunn, T. F. Marinis, W. M. Sherry, and C. J. Williams, Mat. Res. Soc. Proc., 40, p.129, 1985.
[WAN] K. Z. Wang and C. M. Chen, J. Electron, Mater., 34, p.1543, 2005.
[Yu] D. Q. Yu, H. P. Xie and L. Wang, J. Alloy Comp., 2004, v.385, p.119-125.
[ZEN1] K. Zeng, V. Vuorinen, and J. K. Kivilahti, IEEE Trans. Electron. Packag. Manufact., 25, p.162, 2002.
[ZEN2] K. Zeng and K. N. Tu, Mater. Sci. Eng., R27, p.95, 2000.
[張道智] 張道智、張喬雲、游善溥,”無鉛組裝技術現況與趨勢”,表面黏著技術,vol.50,p.16-34,2005
[謝宗雍] 謝宗雍,”電子構裝技術簡介”,電子月刊第三卷第七期,1997 年7 月,p.57-p.76 |