參考文獻 |
[1]. S. Hosoe, “Laser interferometric system for displacement measurement with high precision,” Nanotechnology, 2, 88-95 (1991).
[2]. Y. Jourlin, et al., “Compact diffractive interferometric displacement sensor in reflection,” Precision Engineering, 22 ,1-6 (2002).
[3]. O. G. Helleso, et al., “Interferometric displacement sensor made by integrated optics on glass,” Sensor and Actuators, 47, 479-481 (1995).
[4]. T. Kubota, et al., “Interferometric for measuring displacement and distance,” Optics Letters, 12, 310-312 (1987)
[5]. S. T. Lin, K. T. Lin, and W. J. Syu, “Angular interferometer using calcite prism and rotating analyzer,” Optics Communications. 277(2), 251–255 (2007).
[6]. P. J. Caber, “Interferometric profiler for rough surfaces,” Applied Optics, 32, 3438-3441 (1993).
[7]. O. Sasaki, and H. Okazaki, “Sinusoidal phase modulating interferometry for surface profile measurement,” Applied Optics, 25, 3137-3140 (1986).
[8]. M. H. Chiu, J. Y. Lee, and D. C. Su, “Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry,” Applied Optics, 36, 2936-2939 (1997).
[9]. H.F. Talbot, “Facts relating to optical science,” Philosophical Magazine Series 3, 9(56), 401-407 (1836).
[10]. S. Wu, et al., “Wafer surface measurements using shadow Moiré with Talbot effect,” ASME 6, 369-376 (1997).
[11]. Lord Rayleigh, “On the manufacture and theory of diffraction-gratings,” Philosophical Magazine, 47(310), 81-93 (1874).
[12]. Y. Nakano, “Automatic measurements of the small angle variation using a holographic moiré interferometry and a computer processing,” Proceedings of SPIE, 673, 180-183 (1986).
[13]. K. S. Yen, M. M. Ratnam, “Comparison of in-plane displacement measurement from circular grating moire fringes using Fourier transformation and graphical analysis,” Optics and Lasers in Engineering, 50,687-702 (2012).
[14]. S. Kishimoto, X. Huimin, N. Shinya, “Electron moiré method and its application to micro-deformation measurement,” Optics and Lasers in Engineering, 34, 1-14 (2000).
[15]. C. M. Liu, L. W. Chen, “Using the digital phase-shifting projection moiré method and wavelet transformation to measure the deformation of a PMMA cantilever beam,” Polymer Testing, 24, 576-582 (2005).
[16]. 賴律臻,「差動式疊紋自動頓交技術」,國立中央大學,碩士論文,民國100年。
[17]. 林佑儒,「疊紋自動對焦技術」,國立中央大學,碩士論文,2010。
[18]. N. S. Liou “Specimen gratings made from body art paper for in-plane moire strain analysis,” Polymer Testing, 24, 535-539 (2005).
[19]. N. S. Liou, C. Y. Huang, “Fourier transform moire strain analysis by using cross gratings produced from iron-on paper and inkjet printer,” Polymer Testing, 22, 487-490 (2003).
[20]. K. Creath and J. C. Wyant, Optical Shop Testing (John Wiley & Sons.Inc, 1992), Chap. 16.
[21]. R. Weller and B. M. Shepard, “Displacement measurements by mechanical interferometry,” Proc. SESA 6, 35-38 (1948)
[22]. F. P. Chiang and C. C. Kin, “Some optical techniques of displacement and strain measurements on metal surfaces,” Journal of Metals, 35, 49-53 (1983).
[23]. J. Mu, et al., “Error analysis of phase shifting by varying the incident angle of parallel beams in shadow Moiré,” Optik, 124,6769-6771 (2013).
[24]. 張家壽,「應用數位投影疊紋法於微小尺寸表面之量測」,國立台灣大學,碩士論文,2000。
[25]. 潘同宣,「疊紋自動準直儀系統」,國立中央大學,碩士論文,民國102年。
[26]. B. Wang, “Moire deflectometry based on Fourier-transform analysis,” Measurement, 25, 249-253 (1999).
[27]. M. Wang, “Subfringe integration method for automatic analysis of moire deflection tomography,” Optical Engineering, 39(10), 27262733 (2000).
[28]. W. R. J. Funnell, “Image processing applied to the interactive analysis of interferometric fringes,” Applied Optics, 20, 3245-3250 (1981).
[29]. R. S. Chang, et al., “Analysis of CCD moiré pattern for micro-range measurements using the wavelet transform,” Optics and Lasers Technology, 35(1), 43-47 (2003).
[30]. Skullsinthestars, “Rolling out the (optical) carpet: the Talbot effect,” http://skullsinthestars.com/2010/03/04/rolling-out-the-optical-carpet-the-talbot-effect.
[31]. E. Hhecht, Optics, 4th ed. (Addison Wesley, 2002) Chap. 8.
[32]. 李正中,薄膜光學與鍍膜技術,(藝軒圖書出版社,2006)
[33]. B. Neumann, U. Müller, “Fabry-Perot interferometer with a quarter-wave retarder and an intermediate optical exit for displacement-measurements,” Optil, 112(2),81-85 (2001). |