博碩士論文 105225013 詳細資訊




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姓名 彭榆恩(Yu-En Peng)  查詢紙本館藏   畢業系所 統計研究所
論文名稱 串聯系統加速壽命試驗之最佳妥協設計
(Optimal Compromise Design for a Series System Under Accelerated Life Tests)
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摘要(中) 在系統可靠度的加速壽命試驗中,不同應力下的樣本數配置將會影響正常應力下,系統可靠度推論的精準性。本文考慮兩元件串聯系統之三應力加速壽命試驗的最佳樣本配置問題,其中各元件壽命具獨立指數分配。假設最佳樣本配置比例介於(0, 1/2),且三應力為妥協設計下,理論推導D-最佳化樣本配置比例之確切解,亦討論其實務意義。此外,三應力中第二應力之兩元件平均壽命若相等,則可理論求其最佳應力水準之設定。最後,輔以實際例子說明使用最佳樣本配置,最多可提高原始設計約40%之相對效率。
摘要(英) In accelerated life tests of system reliability, the accuracy of the reliability inference can be affected by the sample size allocation under different stress levels. Given three stress levels of an accelerated variable, this thesis considers the problem on the optimal allocation for a series system with two independent exponential distributions of the components under accelerated life tests. For a compromise design with the assumption of all optimal allocations being in (0, 1/2), the exact D-optimal sample size allocations are analytically derived and the experimental implication is provided as well. Furthermore, the optimal stress levels are determined when the mean-time-to-failures of the two components are assumed to be equal at the median stress level. The analytic results are illustrated and verified by two real examples. The numerical results show that the relative efficiency of the three-level optimal allocation to the original design can be enhanced at most 40%.
關鍵字(中) ★ 串聯系統
★ 加速壽命試驗
★ 二階基本對稱函數
★ 妥協設計
★ D-最佳化
★ 結式
關鍵字(英) ★ Series system
★ Accelerated life tests
★ Second elementary symmetric function
★ Compromise design
★ D-optimality
★ Resultant
論文目次 第一章 緒論 ............ 1
1.1 研究動機 ............ 1
1.2 文獻回顧 ............ 2
1.3 研究方法 ............ 4
1.4 論文架構 ............ 4
第二章 最佳化二階基本對稱函數之相關結果 ............ 6
2.1 串聯之加速壽命模型D-最佳化之樣本配置 ............ 6
2.2 兩元件串聯系統之D-最佳化妥協設計 ............ 9
2.3 二階基本對稱函數之最佳化 ............ 10
第三章 妥協設計之D-最佳化樣本配置 ............ 15
3.1 兩二階基本對稱函數乘積之結式與最佳化結果 ............ 15
3.2 三應力為妥協設計之D-最佳化樣本配置 ............ 19
3.3 妥協設計D-最佳化樣本配置之性質 ............ 29
3.4 妥協設計之D-最佳化應力水準............ 33
第四章 實例分析 ............ 35
4.1 B-型絕緣資料 ............ 35
4.2 H-型絕緣資料 ............ 38
第五章 結論與未來研究 ............ 44
參考文獻 ............ 45
附錄 ............ 49
參考文獻 [1] Bai, D. S. and Chung, S. W. (1991). An optimal design of accelerated life test fornexponential distribution. Reliability Engineering and System Safety, 31, 57–64.
[2] Bai, D. S. and Chung, S. W. (1992). Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring. IEEE Transactions on Reliability, 41, 400–406.
[3] Bai, D. S. and Kim, M. S. (1993). Optimum simple step—stress accelerated life tests for Weibull distribution and type I censoring. Naval Research Logistics, 40, 193–210.
[4] Chernoff, H. (1962). Optimal accelerated life designs for estimation. Technometrics, 4, 381–408.
[5] Chung, S. W. and Bai, D. S. (1998). Optimal designs of simple step-stress accelerated life tests for lognormal lifetime distributions. International Journal of Reliability, Quality and Safety Engineering, 5, 315–336.
[6] Escobar, L. A. and Meeker, W. Q. (2006). A review of accelerated test models. Statistical science, 21, 552–577.
[7] Hodge, W. V. D. and Pedoe, D. (1994). Methods of Algebraic Geometry. Cambridge University Press, Cambridge.
[8] Hsu, T. M. (2016). Reliability analysis and optimal design for series systems under multiple type-I censoring. PhD Dissertation, National Central University.
[9] Hsu, T. M., Emura, T. and Fan, T. H. (2016). Reliability inference for a copulabased series system life test under multiple type-I censoring. IEEE Transactions on Reliability, 65, 1069–1080.
[10] Kielpinski, T. J. and Nelson, W. (1975). Optimum censored accelerated life tests for normal and lognormal life distributions. IEEE Transactions on Reliability, 24, 310–320.
[11] Kim, C. M. and Bai, D. S. (2002). Analyses of accelerated life test data under two failure modes. International Journal of Reliability, Quality and Safety Engineering, 9, 111–125.
[12] Klein, J. P. and Basu, A. P. (1981). Accelerated life testing under competing exponential failure distributions. Indian Association for Productivity, Quality and Reliability, 7, 1–20.
[13] Klein, J. P. and Basu, A. P. (1982). Accelerated life tests under competing Weibull causes of failure. Communications in statistics-Theory and Methods, 11, 2271–2286.
[14] Ma, H. and Meeker, W. Q. (2008). Optimum step-stress accelerated life test plans for log?location-scale distributions. Naval Research Logistics, 55, 551–562.
[15] Mazzuchi, T. A., Soyer, R. and Vopatek, A. L. (1997). Linear Bayesian inference for accelerated Weibull model. Lifetime Data Analysis, 3, 63–75.
[16] Meeker, W. Q. and Nelson, W. (1975). Optimum accelerated life-tests for the Weibull and extreme value distributions. IEEE Transactions on Reliability, 24, 321–332.
[17] Meeker, W. Q., Escobar, L. A. and Lu, C. J. (1998). Accelerated degradation tests: modeling and analysis. Technometrics, 40, 89–99.
[18] Meeker, W. Q., Sarakakis, G. and Gerokostopoulos, A. (2013). More Pitfalls of Accelerated Tests-Rejoinder. Journal of Quality Technology, 45, 213–222.
[19] Nelson, W. (1990). Accelerated Life Testing: Statistical Models Test Plan and Data Analysis. Wiley, New York.
[20] Nelson, W. and Kielpinski, T. J. (1976). Theory for optimum censored accelerated life tests for normal and lognormal life distributions. Technometrics, 18, 105–114.
[21] Nelson, W. and Meeker, W. Q. (1978). Theory for optimum accelerated censored life tests for Weibull and extreme value distributions. Technometrics, 20, 171–177.
[22] Nickalls, R. W. D. (2006). Viete, Descartes and the cubic equation. The Mathematical Gazette, 90, 203–208.
[23] Ng, H. K. T., Balakrishnan, N. and Chan, P. S. (2007). Optimal sample size allocation for tests with multiple levels of stress with extreme value regression. Naval Research Logistics, 54, 237–249.
[24] Peng, C. Y. (2012). A note on optimal allocations for the second elementary symmetric function with applications for optimal reliability design. Naval Research Logistics, 59, 278–284.
[25] Suzuki, K., Nakamoto, T. and Matsuo, Y. (2010). Optimum specimen sizes and sample allocation for estimating Weibull shape parameters for two competing failure modes. Technometrics, 52, 209–220.
[26] Tai, C. Y. (2017). Optimal sample size allocation for a series system under accelerated life tests. Master Thesis, National Central University.
[27] Tseng, S. T., Balakrishnan, N. and Tsai, C. C. (2009). Optimal step-stress accelerated degradation test plan for gamma degradation processes. IEEE Transactions on Reliability, 58, 611–618.
[28] Tseng, S. T., Tsai, C. C. and Balakrishnan, N. (2011). Optimal sample size allocation for accelerated degradation test based on Wiener process, In: N. Balakrishnan (Editor), Methods and Applications of Statistics in Engineering, Quality Control, and the Physical Sciences. Wiley, New York, 330–343.
指導教授 樊采虹 彭健育 審核日期 2018-8-23
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