博碩士論文 105232013 詳細資訊




以作者查詢圖書館館藏 以作者查詢臺灣博碩士 以作者查詢全國書目 勘誤回報 、線上人數:15 、訪客IP:107.23.85.179
姓名 王文慶(Wen-Ching Wang)  查詢紙本館藏   畢業系所 照明與顯示科技研究所
論文名稱 利用自動對焦改善子孔徑相位拼接演算法之研究
(Improvement of Subaperture Phase-Stitching Algorithm by Autofocus)
相關論文
★ 以反應性射頻磁控濺鍍搭配HMDSO電漿聚合鍍製氧化矽摻碳薄膜阻障層之研究★ 軟性電子阻水氣膜之有機層組成研究
★ 利用介電質-金屬對稱膜堆設計雙曲超穎材料並分析其光學特性★ 石墨烯與超導金屬介面的電子穿隧行為
★ 石墨烯透明導電膜與其成長模型之研究★ 電漿輔助石墨烯直接成長在Pt上成長機制
★ 以磁控電漿輔助化學氣相沉積法製鍍有機矽阻障層之研究★ 以電漿聚合鍍製氧化矽摻碳氫薄膜應力之研究
★ 快速退火影響石墨烯晶粒尺寸之研究★ 電漿輔助低溫化學氣相沉積法直接成長石墨烯/金屬複合透明導電薄膜
★ 快速退火生長高品質石墨烯★ 改善石墨烯轉印品質之研究
★ 暗場顯微鏡系統監控石墨烯成長之研究★ 以射頻磁控濺鍍鍍製多層有機矽阻障層研究
★ 真空聚合物薄膜在三維曲面研究★ 利用有限元素方法分析光譜合束器之多層介電質繞射光柵之繞射效率
檔案 [Endnote RIS 格式]    [Bibtex 格式]    [相關文章]   [文章引用]   [完整記錄]   [館藏目錄]   [檢視]  [下載]
  1. 本電子論文使用權限為同意立即開放。
  2. 已達開放權限電子全文僅授權使用者為學術研究之目的,進行個人非營利性質之檢索、閱讀、列印。
  3. 請遵守中華民國著作權法之相關規定,切勿任意重製、散佈、改作、轉貼、播送,以免觸法。

摘要(中) 隨著科技的發展,各項產品及設備中所使用的光學元件如反射鏡、各類型的透鏡、稜鏡、分光鏡…等等均被廣泛的使用,而光學元件的品質會直接影響一個光學系統的好壞,因此檢驗光學元件的技術就顯得相當的重要。
本文以掃描式白光干涉技術配合包絡法掃瞄並紀錄干涉訊號的強度,並透過數學計算將干涉強度轉換成相位資訊,再以目前常見檢測技術中非接觸式的子孔徑相位拼接技術,將光學元件的表面予以還原,在過程中,為了要量測多個區域的相位資訊,需要移動被測元件的位置,而此一步驟會導致干涉訊號消失,需要手動調整,不過調整的過程中無法精確的調整到干涉訊號最強的位置,這樣可能會導致掃描後所還原的相位資訊產生誤差甚至是遺失。
因此,本研究引入被動式自動對焦演算法,以邊緣檢測的數學運算為基底,搭配垂直移動之電控平台,紀錄影像強度後計算對焦值,並自動尋找出干涉訊號明顯的位置。在比較量測透鏡LA-1708的數據後,由手動對焦計算出的曲率半徑誤差為2.79%,自動對焦計算出的曲率半徑之誤差減少為1.45%,可以有效的減少人為調整所產生的誤差情形。
摘要(英) With the development of technology, optical components such as mirrors, various types of lenses, prisms, beam-splitters, etc. are widely used in various products and equipment, and the quality of optical components directly affects the quality of an optical system. Therefore, the technology for testing optical components is quite important.
In this paper, scanning white light interference technology is used to scan and record the intensity of the interference signal, and the interference intensity is converted into phase information through mathematical calculation. Then, the subaperture phase stitching technology is used to optical. The surface of the component is restored. In the process, in order to measure the phase information of multiple regions, the position of the component to be tested needs to be moved, and this step will cause the interference signal to disappear, which requires manual adjustment, but the adjustment process cannot be accurate. The adjustment may cause errors or even loss of phase information restored after scanning.
Therefore, this study introduces a passive autofocus algorithm, based on the mathematical operation of edge detection, with the electronic platform of vertical movement, records the image intensity, calculates the focus value, and automatically found. After comparing the data of the lens LA-1708, the curvature radius error calculated by manual focus is 2.79%, and the error of the radius of curvature calculated by autofocus reduced to 1.45%, which can effectively reduce the error caused by artificial adjustment.
關鍵字(中) ★ 子孔徑接合
★ 掃描式白光干涉儀
★ 自動對焦
關鍵字(英) ★ Subaperture Stitching
★ White-light Scanning Interferometry
★ autofocus
論文目次 摘要 I
Abstract II
致謝 III
目錄 IV
圖目錄 VII
表目錄 IX
第一章 緒論 1
1-1 前言 1
1-2 研究動機 4
1-3 本文架構 5
第二章 理論 6
2-1 白光干涉技術 6
2-1-1 干涉技術發展 6
2-1-2 相移干涉技術 9
2-1-3 垂直掃描式干涉技術 11
2-2 自動對焦技術 17
2-2-1 薄透鏡成像公式 17
2-2-2 自動對焦概論 18
2-2-3 主動式自動對焦 18
2-2-4 被動式自動對焦 19
2-2-5 被動式自動對焦演算法 20
2-3 子孔徑相位拼接技術 24
2-3-1 最小平方法 24
2-3-2 子孔徑拼接模型 25
2-3-3多子孔徑拼接 28
第三章 實驗架構與研究方法 29
3-1 實驗架構 29
3-2 研究方法 33
3-2-1 自動對焦演算法 33
3-2-2 子孔徑相位拼接演算法 33
3-2-3 實驗步驟 34
第四章 結果與討論 36
4-1系統校正 36
4-1-1 自動對焦演算法預處理 36
4-1-2 子孔徑相位拼接演算法模擬 38
4-2實驗結果與討論 40
4-2-1 自動對焦演算法標準片量測 40
4-2-2 自動對焦演算法干涉條紋量測 42
4-2-3 標準片之拼接 47
4-2-4 球面透鏡之拼接 48
第五章 結論 56
未來展望 59
參考文獻 60
參考文獻 [1] C.-J. Kim, “Polynomial fit of interferograms ”, Applied optics, Vol 21, pp. 4521-4525, 1982.
[2] Jon Fleig, Paul Dumas, Paul E. Murphy and Greg W. Forbes, “An automated subaperture stitching interferometer workstation for spherical and aspherical surfaces ”, SPIE Vol 5188, pp. 296-308, 2003.
[3] ZOU Kaixuan, FENG Yunpeng and WANG Zhong, “Research on Subaperture Stitching Algorithm Based on Image Processing ”, Imaging Science and Photochemistry, Vol 34, pp. 88-94, 2016.
[4] Greg A. Smith, Chunyu Zhao, Peng Su and James H. Burge, “Subaperture stitching performance estimation ”, SPIE, Vol 8838, 2013.
[5] Lei Zhang, Chao Tian, Dong Liu, Tu Shi Yongying Yang, Hanshuo Wu, and Yibing Shen, “Non-null annular subaperture stitching interferometry for steep aspheric measurement ”, Applied optics, Vol 53, pp. 5755-5762, 2014.
[6] Hung-Sheng Chang, Chao-Wen Liang, Po-Chih Lin, and Yi-Chun Chen, “Measurement improvement by high overlapping density sub-aperture stitching interferometry ”, Applied optics, Vol 53, pp. 102-108, 2014.
[7] James H. Burge and Chunyu Zhao, “Applications of subaperture stitching interferometry for very large mirrors ”, SPIE, Vol 8450, 2012.
[8] Shanyong Chen, Shengyi Li, Yifan Dai, and Ziwen Zheng, “Iterative algorithm for subaperture stitching test with spherical interferometers ”, JOSA A, Vol 23, pp. 1219-1226, 2006.
[9] Pan, F., Lu, X., Dong, B., Ma, X. and Xiao W, “Subaperture stitching interferometry based on digital holography ”, Optics and Lasers in Engineering, Vol 86, pp. 228-235, 2016.
[10] Chen, S., Dai, Y., Li, S., Shi, F. and Peng, “Surface registration-based stitching of quasi-planar free-form wavefronts ”, Optical Engineering, Vol 51, 2012.
[11] P. Zhang, H. Zhao, X. Zhou, and J. Li, “Sub-aperture stitching interferometry using stereovision positioning technique ”, Optics Express, Vol 18, pp. 15216-15222, 2010.
[12] Liu, Ying-Moh, George N. Lawrence, and Christ L. Koliopoulos, “Subaperture testing of aspheres with annular zones ”, Applied optics, Vol 27, pp. 4504-4513, 1988.
[13] Huang, Jun S., and Dong H. Tseng, “Statistical theory of edge detection ”, Computer vision, graphics, and image processing, Vol 43, pp. 337-346, 1988.
[14] Parker, Jim R, Algorithms for image processing and computer vision, John Wiley & Sons, (2010)
[15] Chern, N. Ng Kuang, Poo Aun Neow, and Marcelo H. Ang, “Practical issues in pixel-based autofocusing for machine vision ”, IEEE International Conference on, Vol 3, pp.2791-2796, 2001.
[16] Patrick Sandoz and Gilbert Tribillon, “Profilometry by zero-order interference fringe identification ”, Journal of Modern Optics, Vol 40, pp. 1691-1700, 1993.
[17] Kittler Josef, “On the accuracy of the Sobel edge detector ”, Image and Vision Computing, Vol 1, pp. 37-42, 1983.
[18] Vincent, O. Rebecca, and Olusegun Folorunso, “A descriptive algorithm for sobel image edge detection ”, Proceedings of Informing Science & IT Education Conference, Vol 40, pp.97-107, 2009.
[19] Yi Yao, Besma Abidi, Narjes Doggaz and Mongi Abidi, “Evaluation of sharpness measures and search algorithms for the auto focusing of high-magnification images ”, SPIE, Vol 6246, 2006.
[20] Krotkov Eric, “Focusing ”, International Journal of Computer Vision Vol 1, pp. 223-237, 1988.
[21] Bansal Raghav, Gaurav Raj and Tanupriya Choudhury, “Blur image detection using Laplacian operator and Open-CV ”, System Modeling & Advancement in Research Trends IEEE, pp. 63-67, 2016.
[22] Wang Xin, “Laplacian operator-based edge detectors ”, IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol 29, pp. 886-890, 2007.
[23] 林柏至,「非球面檢測之迭代相移干涉與子孔徑相位接合演算法開發」,國立中央大學,碩士論文,民國100年。
[24] Kieran G. Larkin, “Efficient nonlinear algorithm for envelope detection in white light interferometry ”, JOSA A, Vol 13.4, pp. 832-843, 1996.
[25] Wan Der-Shen, “Methods and systems for white light interferometry and characterization of films ”, U.S. Patent, No. 7,649,634, 2010.
指導教授 郭倩丞(Chien-Cheng Kuo) 審核日期 2018-8-14
推文 facebook   plurk   twitter   funp   google   live   udn   HD   myshare   reddit   netvibes   friend   youpush   delicious   baidu   
網路書籤 Google bookmarks   del.icio.us   hemidemi   myshare   

若有論文相關問題,請聯絡國立中央大學圖書館推廣服務組 TEL:(03)422-7151轉57407,或E-mail聯絡  - 隱私權政策聲明