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姓名	湯博雯(Po-Wen, Tang)  查詢紙本館藏	畢業系所	光電科學與工程學系
論文名稱	表面電漿於隨機結構與孤立奈米粒子之電磁局域增強與偏振旋性操控 (Study of surface plasmon enhanced local electromagnetic field and chiral polarization manipulation in random and isolated nanoparticles)
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摘要(中)	本文研究表面電漿於隨機結構與孤立奈米粒子團的電磁場局域增強及偏振旋性操控特性。透過消光譜量測、廣義多粒子米氏散射模擬、超解析四波混合及數位化色度空間等方法，研究表面電漿於上述結構產生之模態分布、共振波長飄移、線性與非線性光學響應、偏振態旋轉，及其應用於奈米環境感測之潛力。 隨機結構包括以鈉-銀離子交換製做出含不同尺寸及填充率之銀奈米粒子複合玻璃與濺鍍方式製做島狀分布金薄膜。調控製程參數，前者可產生共振波長自380 nm至540 nm一系列的帶止濾波玻璃，而後者在接近滲流閥值時有最高的電磁場增強效應。由於薄膜於此閥值下各尺度自我相似之特性，利用四波混合的三階非線性光學效應，在大範圍隨機薄膜結構上以遠場光學方法標定出單一狹縫結構熱點，並於120 nm × 70 nm的尺度範圍追跡熱點中心的波長響應。 在孤立奈米粒子團的研究對象包括:單體、雙聚體及三聚體。這部分的研究排除了隨機結構或非孤立系統的平均效應，而能較清楚呈現各效應之成因及物理機制。在單體部分，藉由廣義多粒子米氏散射模擬光譜結合數位化色度空間，建立了一套利用色座標變化來量測奈米環境折射率變化的感測方式，以24位元的彩色攝影機可檢出折射率變化0.0021的環境改變，相當於傳統可攜式光譜儀解析能力的4.8倍。在雙聚體的研究上，發現此為能產生單一光學旋性的最基本單元。除探討狹縫模態單一光學旋性的成因外，亦評價以色度座標飄移檢測待測分子手徵特性之優劣。最後透過金奈米粒子三聚體，探討在奈米尺度任意操控偏振態的可能。沿三聚體的雙軸基底分別以線性及非線性光學四波混合上，探討其出射光的偏振態與波長間的關聯性。成功地的在孤立的三聚體操控產出偏振消光比 = 20的準線偏振光至 = 2.31的橢圓偏振光。搭配寬頻四波混合線性啁啾的特性，可簡易地以調整時間延遲來操控出射波長以及偏振特性，建立一波長偏振可調的奈米光源。
摘要(英)	In this thesis, plasmonically enhanced local electromagnetic (EM) field and chiral polarization manipulation in random and isolated nanoparticles are studied. Based on extinction spectrum measurement, generalized multi-particle Mie (GMM) scattering simulation, super-resolved four wave mixing (FWM), and digitized chromatic space, one had dug out plasmonically modal distribution, resonant wavelength shift, linear and nonlinear optical responses, polarization rotation, and the potential for nano-environment sensing. For random structures, Na+-Ag+ ion exchanged composite glass and sputtering deposited thin films with a variety of filling fractions (FF) are studied. By controlling fabrication parameters, composite glasses with resonant wavelength ranges from 380 to 540 nm are obtained. These can be used as a series of stop band filters. As for the random films, it is found that the highest enhancement for the local EM field occurs when the FF reaches to the percolation threshold. Due to the property of self-similarity at percolation threshold, a single nano-interstice associated with the plasmonic hot spot over a large range can be located using the 3rd order FWM effect in far field. Besides, the position of hot spots with various resonant wavelength can be traced within a region of 120 nm × 70 nm, reflecting the mophlogical features of the film. Regarding to isolated nanoparticle clusters, plasmonic monomer, dimer, and trimer are studied. This part research rules out the ensemble averaged effect and thereby the physical mechanisms behind can be clearly seen. For plasmonic monomer, GMM simulation is combined with digitized color space, which establishes a new nano-environment sensing method. Without utilizing spectrometer, index variation as small as 0.0021 can be resolved based on the corresponding chromaticity shift measured by a 24 bit color CCD. Compared with conventional portable spectrometers, this resolution is more than 4.8 times. In the case of plasmonic dimers, we show that this is the very fundamental unit which can generate homo optical chirality. Apart from the discussion of the origin of homo optical chirality, we also assess the capability of identifying the handedness of chiral molecules by means of the enhanced chromaticity shift. Finally, for the case of plasmonic trimmers, the manipulation of polarization at nanoscale is studied. By pumping along 2 eigen-directions in combination of optical FWM, the polarization and the output wavelength can be controlled. We successfully obtained nearly linear polarized light with extinction  = 20 and elliptical light with  = 2.31, demonstrating the potential of constructing nanoemitters with tunable wavelength and polarization.
關鍵字(中)	★ 表面電漿子學 ★ 奈米光學 ★ 偏振 ★ 旋性感測 ★ 四波混頻 ★ 色度學 ★ 影像處理	關鍵字(英)	★ Plasmonics ★ Nano optics ★ Polarization ★ Chiral sensing ★ Four-wave mixing ★ Colorimetry ★ Image processing
論文目次	中文摘要 i Abstract ii 誌謝 iv 目錄 v 圖目錄 viii 表目錄 xv 第1章 序論 1 1.1 前言 1 1.2 表面電漿子系統簡介 2 1.3 研究動機 4 1.4 文獻回顧 5 1.5 論文架構 7 第2章 表面電漿波基本模態特性簡介 9 2.1 羅倫茲杜德模型 9 2.2 表面電漿子之結構效應與電磁場分布 14 第3章 大範圍表面電漿子系統波長及空間響應特性 21 3.1 離子交換玻璃含銀粒子複合材料色散特性 21 3.2 金薄膜上之特性 27 3.2.1 金薄膜成長過程基本形貌以及電性演化 27 3.2.2 金薄膜線性穿透光譜隨薄膜形貌變化 30 3.2.3 金薄膜之四波混頻非線性光學特性 31 3.3 金薄膜內獨立熱點特性 37 3.3.1 離散島狀金結構之四波混頻影像 37 3.3.2 連續滲流閥值下金薄膜之四波混頻影像 44 第4章 孤立奈米粒子團模態偏振簡介 52 4.1 米氏理論 52 4.2 奈米粒子團模態特性 60 4.3 光學偏振疊加 64 第5章 單團表面電漿子系統偏振旋光特性 68 5.1 顏色辨識檢測金單體局域環境折射率 68 5.1.1 光源端組成優化 69 5.1.2 偵測端攝影機參數優化 75 5.2 銀二聚體之光學旋性 82 5.3 銀二聚體分子旋性辨識 91 5.4 金三聚體線性散射 99 5.4.1 金三聚體散射光模態散射譜形特徵計算 99 5.4.2 金三聚體基本模態特性量測及以混合偏振激發散射光偏振特性 101 5.4.3 利用圓錐折射檢驗奈米粒子團散射偏振組合 110 5.5 金奈米粒子團四波混頻特性 115 5.5.1 偏振相依四波混頻 115 5.5.2 四波混頻頻譜干涉波長相依偏振檢測 117 第6章 結論與未來展望 129 6.1 結論 129 6.2 未來與展望 131 附錄 研究方法及技術 132 附錄A. 鈉銀離子交換製作 132 附錄B. 金薄膜填影像充率計算 136 附錄C. 金薄膜狹縫定位 138 附錄D. 孤立奈米粒子樣品準備及團定位 143 附錄E. 廣義多顆粒子米氏散射計算 146 附錄F. 消光譜量測系統 151 附錄G. 孤立奈米粒子團散射光譜量測 154 附錄H. 寬頻四波混頻量測系統 158 附錄I. 四波混頻雙光子放光背景消除方法 166 附錄J. 反捲積圖像轉換 169 附錄K. CIE色度座標系及影像顏色判定 173 附錄L. 光學偏振檢測系統 182 L.1. 偏振片波板直接檢偏 182 L.2. 圓錐折射檢測 184 L.3. 頻譜干涉 194 參考文獻 199
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指導教授	戴朝義(Chao-Yi, Tai)	審核日期	2019-7-23
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