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姓名	洪嘉妤(Jia-Yu Hong)  查詢紙本館藏	畢業系所	統計研究所
論文名稱	具ED過程之兩因子加速衰退試驗建模研究 (Modeling Two Factors Accelerated Degradation Testing Based on ED Process)
檔案	[Endnote RIS 格式]    [Bibtex 格式]    [相關文章]   [文章引用]   [完整記錄]   [館藏目錄]   至系統瀏覽論文 ( 永不開放)
摘要(中)	產品的可靠度常用一因子的加速衰退試驗進行測試，並推論產品壽命。但可能影響產品壽命的不只一個因子， 因此本文考量了具ED過程之兩因子恆定應力加速衰退試驗(CSADT)的隨機過程模型，並使用數值方法推估產品失效壽命分佈。常見的三種隨機過程Wiener, Gamma, Inverse-Gaussian 過程都是Tweedie ED 過程的特例。 我們考慮兩因子試驗可能有交互作用影響，故交互作用項列入模型的考量。 我們使用兩組兩因子加速衰退試驗的真實資料，進行比較。考慮兩因子是否有交互作用、不同的加速模型，以及Wiener, Gamma, Inverse-Gaussian和ED 過程組合不同的隨機過程模型。主要結論為Tweedie ED process模型在資料上配適上優於其他模型。
摘要(英)	Product′s reliability is often obtained by an one-factor accelerated degradation testing and then calculated by the inferred lifetime distribution of products. However, there may be more than one factor that can affect the life of the product. This thesis considers stochastic process model of two-factor constant-stress accelerated degradation testing based on ED process. The numerical method is used to estimate the product′s failure lifetime distribution. The three common stochastic processes: Wiener, Gamma and Inverse-Gaussian, are special cases of Tweedie ED process. We consider that the two-factor test may have an interaction effect and put the interaction term into the models. We used two sets of real two-factor accelerated degradation data to compare with the models by considering the interaction term, different accelerated forms and four stochastic processes. The main conclusion is that the Tweedie ED process model is better than others in model fitting.
關鍵字(中)	★ 加速衰退試驗 ★ 兩因子交互作用 ★ 隨機過程 ★ ED過程	關鍵字(英)	★ accelerated degradation test ★ two-factor interaction term ★ stochastic process ★ ED process
論文目次	摘要 i Abstract ii 目錄 iii 圖目錄 vii 表目錄 viii 第一章 緒論 1.1 研究動機.................................... 1 1.2 文獻探討 .................................... 2 1.3 研究方法 .................................... 4 1.4 本文架構 .................................... 5 2 第二章 加速衰退模型 6 2.1 隨機過程模型.................................. 6 2.1.1 物理加速模型.............................. 6 2.1.2 具維納過程之加速衰退模型...................... 9 2.1.3 具單調性質之加速衰退模型...................... 11 2.1.4 具ED過程之加速衰退模型...................... 13 2.2 概似函數與最大概似估計量.......................... 17 2.2.1 具維納過程之加速衰退模型參數估計................. 17 2.2.2 具伽碼過程之加速衰退模型參數估計................. 18 2.2.3 具逆高斯過程之加速衰退模型參數估計............... 19 2.2.4 具TweedieED過程之加速衰退模型參數估計. . . . . . . . . . . . 20 2.3產品壽命分佈與可靠度資訊......................... 20 2.3.1 具維納過程之加速衰退模型的產品失效壽命分佈 . . . . . . . . . . 21 2.3.2 產品壽命q分數推論 ........................ 24 3 第三章 實例分析 27 3.1 LED(Xiao) ................................... 27 3.2 LED(Liao).................................... 38 3.3 討論....................................... 47 3.3.1 LED(Xiao)............................... 47 3.3.2 LED(Liao) ............................... 51 4 第四章 結論與未來研究方向 54 A 附錄
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指導教授	樊采虹 鄭順林(Tsai-Hung Fan Shuen-Lin Jeng)	審核日期	2019-8-26
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