利用高功率脈衝磁控濺鍍於(111)矽基板磊晶成長GaN/ZnO薄膜之研究

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姓名

黃政文(Chen-Wen Huang) 查詢紙本館藏

畢業系所

光電科學與工程學系

論文名稱

利用高功率脈衝磁控濺鍍於(111)矽基板磊晶成長GaN/ZnO薄膜之研究

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至系統瀏覽論文 (2025-9-1以後開放)

摘要(中)

目前成長單晶氮化鎵薄膜以有機金屬化學氣相沉積(MOCVD)及分子束磊晶(MBE)為主，有高溫以及高成本的問題，本論文將採用低溫以及低成本且可以大面積製造的高功率脈衝磁控濺鍍法(HiPIMS)取代有機金屬化學氣相沉積(MOCVD)成長氮化鎵薄膜。而用於 GaN 成長的基板材料的另一種有潛力的材料是矽(Si)。
使用矽作為成長 GaN 的基板具有許多優勢，例如:大尺寸，低成本以及在高製程溫度下的熱穩定性。但直接成長GaN於矽基板上，由於晶格常數的巨大不匹配(16.9%)，因此需要尋找適當緩衝層來提升氮化鎵薄膜品質，而氧化鋅(ZnO)與氮化鎵之晶格常數僅相差(1.8%)，因此本論文使用氧化鋅(ZnO)作為緩衝層，進而提升氮化鎵薄膜之結晶品質。
濺鍍氧化鋅緩衝層後，再進行爐管熱退火。由XRD以及SEM分析出，退火後之氧化鋅薄膜之結晶半高寬由0.201°降至0.182°，並且結晶顆粒變大，代表結晶品質提升，但表面粗糙度(RMS)也由3.59 nm提升至13.4 nm。
由SEM量測分析出，當氧化鋅緩衝層之晶粒越大，氮化鎵薄膜之晶粒也會越大。由TEM量測分析出，當氮化鎵薄膜沉積於氧化鋅緩衝層，氮化鎵之結晶方向會延著氧化鋅緩衝層之結晶方向(0002)成長。由上述之量測分析出，ZnO緩衝層之結晶品質越好，GaN薄膜之結晶品質也會隨之提升。因此本論文之未來工作必須解決ZnO緩衝層之表面粗糙度問題，進而提升氮化鎵薄膜之品質。

摘要(英)

Metal organic chemical vapor deposition (MOCVD) is the most popular fabrication method for the crystalline GaN thin film. However, the disadvantages of MOCVD are its high process temperature and the high cost. In this study, a fabrication method high-power impulse magnetron sputtering(HiPIMS) with low-temperature and low-cost are applied to deposit GaN films.
Silicon is one of the attractive substrate materials for GaN, the deposition of thin films with the advantages of low cost and thermal stability at high growth temperatures. But due to the large lattice constant mismatch (16.9%), it is almost impossible to deposit a GaN thin film on the silicon substrate directly. A suitable buffer layer is necessary in between the GaN and the silicon substrate to improve the quality. The lattice constant difference between ZnO and GaN is only 1.8%. So ZnO was used in this research as the buffer layer to improve the crystalline quality of the GaN films.
After depositing the ZnO buffer layer, a thermal annealing process was applied. According to the XRD and SEM analysis, the FWHM of the annealed ZnO(0002) XRD spectrum was decreased from 0.201° to 0.182°, and the crystal grains became larger, indicating that the crystal quality was improved. However, the surface roughness (RMS) was also increased from 3.59 nm to 13.4 nm.
According to the SEM measurement and analysis, the larger the crystal grains of the ZnO buffer layer, the larger the crystal grains of the GaN film. According to the TEM measurement and analysis, when the GaN film was deposited on the ZnO buffer layer, the crystal direction of GaN could grow along the crystal direction (0002) of the ZnO buffer layer. Based on the above measurement and analysis, the better the crystalline quality of the ZnO buffer layer, the better the crystalline quality of the GaN thin film. Therefore, the future work of this research is to improve the surface roughness of the ZnO buffer layer after the annealing, and then it is possible to improve the quality of the GaN films.

關鍵字(中)

★ 氮化鎵
★ 氧化鋅
★ 濺鍍

關鍵字(英)

論文目次

目錄
摘要 i
目錄 v
圖目錄 VIII
表目錄 XI
第一章緒論 1
1-1前言 1
1-2文獻回顧 2
1-3研究動機 4
第二章基礎理論 8
2-1氮化鎵的基本性質 8
2-2氮化鎵之緩衝層介紹 8
2-3高功率脈衝磁控濺鍍製程系統 13
2-3-1高功率脈衝磁控電源 14
第三章實驗機台架構與量測儀器之介紹 17
3-1製程設備介紹 17
3-1-1 磁控濺鍍機台介紹 17
3-1-2 爐管退火系統 18
3-2 薄膜製作流程 19
3-2-1 濺鍍緩衝層之氧化鋅薄膜製作流程 19
3-2-2 氮化鎵薄膜之製作流程 19
3-3分析儀器介紹 20
3-2-1 X-ray繞射儀 20
3-2-2掃描式電子顯微鏡 21
3-2-3 原子力顯微鏡(AFM) 22
第四章實驗結果 23
4-1不同基板對氧化鋅薄膜之分析 23
4-1-1 不同基板對氧化鋅薄膜之薄膜結晶分析(XRD) 23
4-2改變儲能時間(OFF TIME)對氧化鋅薄膜之分析 25
4-2-1 薄膜結晶之分析(XRD) 25
4-2-2 薄膜表面與剖面之結晶分析(SEM) 27
4-3改變製程溫度對氧化鋅薄膜之分析 28
4-3-1 薄膜結晶之分析(XRD) 29
4-3-2 薄膜表面與剖面之薄膜結晶分析(SEM) 30
4-4改變功率對濺鍍氧化鋅薄膜之分析 31
4-4-1薄膜結晶之分析(XRD) 32
4-4-2薄膜剖面與表面分析(SEM) 33
4-4-3薄膜表面之粗糙度分析(AFM) 34
4-5改變氧氣通量對濺鍍氮化鎵在氧化鋅薄膜上之分析 36
4-5-1薄膜結晶之分析(XRD) 37
4-5-2薄膜剖面與表面分析(SEM) 38
4-5-3薄膜表面之粗糙度分析(AFM) 40
4-6調變大氣退火溫度對氧化鋅之薄膜分析 42
4-6-1薄膜結晶之分析(XRD) 42
4-6-2薄膜剖面與表面分析(SEM) 43
4-6-3薄膜表面之粗糙度分析(AFM) 46
4-7改變工作壓力對氮化鎵在不同薄膜上之分析 47
4-7-1 改變工作壓力對氮化鎵薄膜在不同基板上之XRD量測分析 48
4-7-2薄膜剖面與表面分析(SEM) 52
4-7-3 薄膜表面之粗糙度分析(AFM) 54
4-7-4 薄膜結晶之分析(TEM) 56
4-8改變氣體比例氮化鎵在不同薄膜上之分析 63
4-8-1改變氣體比例薄膜結晶之分析(XRD) 63
4-8-2薄膜剖面與表面分析(SEM) 68
4-8-3薄膜表面之粗糙度分析(AFM) 69
4-8-4薄膜結晶分析(TEM) 71
4-9 改變儲能時間(OFF TIME)對氮化鎵薄膜之分析 76
4-9-1 改變儲能時間對氮化鎵薄膜之結晶分析(XRD) 76
4-9-2 薄膜剖面與表面分析(SEM) 79
4-9-3 薄膜表面之粗糙度分析(AFM) 81
4-10 改變製程溫度對氮化鎵在不同薄膜上之分析 84
4-10-1 改變製程溫度對氮化鎵薄膜之結晶分析(XRD) 84
第五章結論與未來研究 87
5-1 結論 87
5-2 未來研究 88
參考文獻 89

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指導教授

陳昇暉

審核日期

2020-8-20

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