摘要(英) |
The Shack-Hartmann Wavefront Sensor is composed of a microlens array and a CMOS sensor, so it must be calibrated first. In this experiment, the Shack-Hartmann Wavefront Sensor is calibrated through a three-dimensional orthogonal system and a dual-axis precision optical encoder rotating platform. The relationship between the point spread function and the incident angle is established for each microlens array, and the microlens array and the CMOS Sensor are fixed to each other through materials with low thermal expansion coefficient to reduce the measurement error caused by thermal energy to the Shack-Hartmann Wavefront Sensor. In terms of CMOS Sensor, integrating sphere and high dynamic range image (High Dynamic Range, HDR) are used to reduce the amount of error caused by the noise of CMOS Sensor itself.
By changing the number of HDR overlays and observing the repeatability of the measurement data, it is verified that HDR can effectively reduce the impact of CMOS Sensor noise on the Shack-Hartmann Wavefront Sensor, which helps to increase the accuracy and repeatability of Shack-Hartmann Wavefront Sensor. The focal position error measurement and the wavefront error measurement under multi-angle are performed on the calibrated Shack-Hartmann Wavefront Sensor, and the repeatability measurement is performed to verify the Shack-Hartmann Wavefront Sensor accuracy and repeatability in focus measurement and wavefront measurement. |
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