摘要(英) |
In this study, we demonstrate the application of indium Gallium Nitride (InGaN) Quantum Wells (QWs) grown on sapphire substrates using Metal-Organic Chemical Vapor Deposition (MOCVD) for Surface-Enhanced Raman Spectroscopy (SERS). We prepared InGaN quantum wells with different indium compositions and surface-cap-layer thicknesses. Varying the band structure with the MOCVD conditions, we were able to control the electron concentration confined within the QWs, and maximize the SERS intensity of DNA dropcasted on the QW surface.
It is found that the three-repeat QW with the indium composition of 15.4 % (emission wavelength: 488 nm) exhibited the highest SERS intensity for DNA detection. Furthermore, we observed the influence of different thicknesses of cap layers on the SERS performance and found that thinner cap layers enhanced the SERS intensity. These findings provide valuable insights and guidance for the development of highly sensitive and reproducible SERS substrates. Additionally, they expand the potential applications of InGaN materials in the fields of biology, medicine, and environmental sciences. |
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