English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 64745/64745 (100%)
造訪人次 : 20472256      線上人數 : 353
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/1856


    題名: 鎳銦表面鍍層對含銀厚膜之抗遷移性研究
    作者: 林智賢;Jyh-Shyan Lin
    貢獻者: 機械工程研究所
    關鍵詞: 厚膜;抗遷移;陽極極化;;;thick films;anti-migration;anodic polarization;nickel;indium
    日期: 2000-07-13
    上傳時間: 2009-09-21 11:33:08 (UTC+8)
    出版者: 國立中央大學圖書館
    摘要: 本論文在探討鎳、銦電鍍層對銀及銀-鈀厚膜抗遷移性之影響。純銀厚膜表面經電鍍1,2,3μm厚度鎳後,浸泡於蒸鎦水中,施以5V偏壓,進行遷移研究,結果顯示:表層經鍍鎳後之銀厚膜,具有抑制銀遷移之效果,此項抗遷移性,隨著鎳鍍層厚度由1至3μm而增加,依序為:1<2<3μm。若以試片中銀鎳組成(wt%)而言則為Ag 純銀厚膜及銀-鈀厚膜表面經電鍍1μm、2μm及3μm銦後,在蒸餾水中施以5V偏壓進行遷移研究,結果顯示︰銀及銀-鈀厚膜表面經鍍1μm厚銦後,即具良好抗遷移性,且此遷移性不受熱處理之影響。 為了解銀遷移原因,在0.01M NaOH水溶液中進行電化學陽極極化分析,配合XPS表面分析,得知鎳、銦鍍層對抗遷移性之貢獻如下:鎳及銦鍍層在厚膜表面因陽極鈍化而生成保護膜,此鈍化膜在鎳表層為NiO及Ni(OH)2及銦表層為In2O3,可以抑制下層厚膜中銀的溶解及氧化。 Resistance to electrolytic migration for the Ni- and In-deposited silver thick-film conductors in distilled water at a bias of 5V has been investigated. For Ni-deposited silver thick films, the resistance to electrolytic migration increases with increasing the thick of the nickel deposits. (i.e. 1μm<2μm<3μm). The Ni-deposited Ag conductors were heat-treated at 400°C for 1 h. The heat-treated Ni-deposited silver conductors have lower resistance to electrolytic migration in comparison with those as deposited conductors with the same nickel composition. Deposition of indium is better than deposition of nickel on silver and silver-palladium thick films to provide higher resistance to electrolytic migration. As long as a thickness of 1μm indium has been electroplated, the indium-deposited thick films are good enough to inhibit the electrolytic migration. The resistance to electrolytic migration remains efficiently even the In-deposited thick films having experienced a heat treatment at 200°C for 20min. Anodic potentiodynamic polarization for Ni- and In-deposited silver thick films in 0.01M NaOH solution has been studied to delineate the mechanism of migration resistance. It was found that the resistance of migration is due to inhibition of silver dissolution from anode. This inhibition was ascribed to oxide passivation arisen from the nickel and indium deposits. The results of ESCA analysis showed that NiO, Ni(OH)2 and In2O3 played an important role on anodic passivation.
    顯示於類別:[機械工程研究所] 博碩士論文

    文件中的檔案:

    檔案 大小格式瀏覽次數
    0KbUnknown994檢視/開啟


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回饋  - 隱私權政策聲明