English  |  正體中文  |  简体中文  |  Items with full text/Total items : 66984/66984 (100%)
Visitors : 22600235      Online Users : 169
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/2124


    Title: 鋁原箔對鋁電解電容器用高壓陽極鋁箔電解腐蝕舉動之影響研究;The different high voltage aluminum foils for electrolytic capacitor on the different electrochemical etching condition, the affect for the increasing ratio of surface.
    Authors: 許志強;CHIH-CHIANG HSU
    Contributors: 機械工程研究所
    Keywords: 鋁電解電容器;foil;aluminum;capacitor
    Date: 2002-06-28
    Issue Date: 2009-09-21 11:38:54 (UTC+8)
    Publisher: 國立中央大學圖書館
    Abstract: 本論文針對鋁電解電容器用高壓陽極鋁箔,選取不同電化學蝕刻條件,探討鋁箔經電化學蝕刻後表面積增加率之影響,並探討鋁原箔對電化學蝕刻時所產生之影響研究。 改變不同電化學蝕刻條件,並使用八種不同的高壓陽極箔,電蝕高壓陽極箔並量測其機械性質,再按照EIAJ的規範對電蝕鋁箔做化成處理,並量測其靜電容量及重量損失率。利用OM觀察鋁箔截面形態與SEM觀察腐蝕孔徑大小。藉由上述分析方法,比較不同電蝕參數所造成的腐蝕形態對陽極鋁箔之靜電容量的影響,以及鋁原的成份、製程對陽極鋁箔之靜電容量的影響。 由實驗結果可知,提高電蝕液溫度會減小腐蝕孔徑、增加腐蝕孔的密度、但造成tunnel長度變短。而提高電流密度對腐蝕孔的孔徑大小、密度則無太大影響,但同樣造成tunnel長度變短。鋁原箔中的主要微量元素Fe、Si對靜電容量的影響很大,隨著Fe、Si含量增加,靜電容量隨之下降。 一般而言,立方體方位佔有率的大小,對高壓陽極鋁箔的靜電容量有很大的影響。但由於本實驗所採用的鋁箔,其立方體方位佔有率都已經在88.2%以上,所以立方體方位佔有率的多寡,對本實驗高壓陽極鋁箔靜電容量的高低影響不大。 This essay is a research regarding to high voltage aluminum foils for electrolytic capacitor on the different electrochemical etching condition, the affect for the increasing ratio of surface. Besides, we will discuss the impact of the aluminum foils for the electrochemical etching. To change the different electrochemical etching condition, and etched eight different foils. Than, we measured its mechanical properties. Furthermore, we formed the etching foils according to the specifications of EIAJ, and measured its capacitance and weight loss ratio. We observed the cross section of etching foils with OM and observed the etched pits with SEM. According to the above mention methods, comparing with the effect of etched surface morphology caused by different etched parameters for the capacitance of high voltage aluminum foils, and the composition and manufacturing process of aluminum foils resulted in the capacitance of the aluminum foils. According to the conclusion of the experience, we know that lower etchant temperature tended to produce wider tunnels, lower tunnel density and longer tunnel length. It was not an obvious impact on the size and density of the etched pits when we increased current density. But it could reduce the length of the tunnel. The trace impurities Fe and Si in aluminum foils have the great influence on capacitance. The amount of Fe and Si went up while the capacitance went down.
    Appears in Collections:[機械工程研究所] 博碩士論文

    Files in This Item:

    File SizeFormat
    0KbUnknown422View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明