Determination of Average Failure Time and Microstructural Analysis of Sn-Ag-Bi-In Solder Under Electromigration

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题名:	Determination of Average Failure Time and Microstructural Analysis of Sn-Ag-Bi-In Solder Under Electromigration
作者:	Wu,AT;Sun,KH
贡献者:	化學工程與材料工程學系
关键词:	UNDER-BUMP-METALLIZATION;EUTECTIC SNPB;JOINTS;CU;INTERCONNECT;SEGREGATION;INDIUM
日期:	2009
上传时间:	2010-06-29 17:26:37 (UTC+8)
出版者:	中央大學
摘要:	Despite the extensive use of Sn-Ag-Cu as a Pb-free solder alloy, its melting point is significantly higher than that of eutectic Sn-Pb solder. Sn-Ag-Bi-In solder is an alternative Pb-free solder, with a melting temperature close to that of eutectic Sn-Pb. This study elucidates the electromigration behavior of Sn-Ag-Bi-In solder and then compares the results with those of the Sn-Ag-Bi system. The behavior of Pb-free Sn-Ag-Bi-In solder strips under electromigration is examined by preparing them in Si (001) U-grooves. The samples are then tested under various temperatures and current densities. Although the compounds thicken near both electrodes with current stressing, the thickness at the anode exceeds that at the cathode. Experimental results of the average failure time indicate that Sn-Ag-Bi-In solder has a longer lifetime than does Sn-Ag-Bi, which is attributed to the zeta phase. Additionally, the zeta phase dissolved by the current in the early stage replenishes the outgoing atomic flux. These atomic fluxes also enhance the growth of abnormally large particles in the middle of the strips. Field-emission electron probe microanalysis (FE-EPMA) results indicate that the amount of indium is reduced after the zeta phase near the cathode is exhausted for extended current stressing time.
關聯:	JOURNAL OF ELECTRONIC MATERIALS
显示于类别:	[化學工程與材料工程研究所] 期刊論文

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