English  |  正體中文  |  简体中文  |  Items with full text/Total items : 69561/69561 (100%)
Visitors : 23721614      Online Users : 701
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/26401


    Title: In Situ Measurements of Thermal and Electrical Effects of Strain in Flip-Chip Silicon Dies Using Synchrotron Radiation X-rays
    Authors: Wu,AT;Tsai,CY;Kao,CL;Shih,MK;Lai,YS;Lee,HY;Ku,CS
    Contributors: 化學工程與材料工程學系
    Keywords: STRESS-ANALYSIS;PACKAGES;ASSEMBLIES;DESIGN
    Date: 2009
    Issue Date: 2010-06-29 17:27:12 (UTC+8)
    Publisher: 中央大學
    Abstract: The use of synchrotron radiation x-rays is a powerful and novel technique for determining the strain distribution in flip-chip dies. In this study, thermal and electrical effects on the strain of such dies were investigated in situ using synchrotron radiation x-rays. Intense light and small beam size allow precise measurement of minute strain variations in the dies. Subtracting from these variations the strains associated with the thermal expansion of silicon yields the real variations of the strain in dies caused by interactions among the various layers of materials in the flip chip. The prominent warpage of the flip chip at various temperatures is associated with changes in the strain in the dies. The values measured using synchrotron x-rays agreed closely with simulation results. The strains in dies of different thicknesses were compared; thinner dies exhibited large variations in strain under various test conditions.
    Relation: JOURNAL OF ELECTRONIC MATERIALS
    Appears in Collections:[化學工程與材料工程研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML395View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明