English  |  正體中文  |  简体中文  |  Items with full text/Total items : 68069/68069 (100%)
Visitors : 23027058      Online Users : 190
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version

    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/26403

    Title: Influence of hot-pressing temperature on the performance of PEMFC and catalytic activity
    Authors: Lin,JC;Lai,CM;Ting,FP;Chyou,SD;Hsueh,KL
    Contributors: 化學工程與材料工程學系
    Date: 2009
    Issue Date: 2010-06-29 17:27:15 (UTC+8)
    Publisher: 中央大學
    Abstract: The influence of hot-pressing temperature on catalytic activity and the performance of proton exchange membrane fuel cells (PEMFCs) was investigated using current-voltage (I-V) polarization, electrochemical impedance spectroscopy (EIS) and cyclic voltammetry (CV). EIS provided detailed information on the contribution, from high to low frequencies, of internal impedance (R-s), interfacial impedance (R-if) and reaction impedance (R-rxn). The ohmic resistance of the cell (R-Omega) was estimated from the I-V diagram for comparison with the R-s and R-if impedances. The Rif is useful for diagnosing catalytic activity and interpreting PEMFC performance. A cell was hot-pressed at 125 degrees C (near the transition temperature of Nafion), an optimum temperature for lowest ohmic resistance and total impedance in response to a maximal catalyst-specific activity.
    Appears in Collections:[化學工程與材料工程研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat

    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明