On the characterization of Al-0.11 wt.%Sc alloy thin film

NCU Institutional Repository > 工學院 > 機械工程研究所 > 期刊論文 > Item 987654321/26876

jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/26876

题名:	On the characterization of Al-0.11 wt.%Sc alloy thin film
作者:	Liao,HL;Lin,JC;Chen,YS;Chuang,CL;Lee,SL
贡献者:	機械工程研究所
关键词:	MG ALLOYS;MICROSTRUCTURE;BEHAVIOR;SCANDIUM;STRENGTH
日期:	2009
上传时间:	2010-06-29 18:02:15 (UTC+8)
出版者:	中央大學
摘要:	The characterizations (i.e., film adhesion, optical reflectivity, illumination aging and anti-corrosion behavior) should be considered for the metallic thin film served as a candidate of autolamp materials. The characterizations of three candidates (i.e., sputtered Al-0.11 wt.% Sc. sputtered pure Al, and thermally evaporated pure Al) have been investigated and compared. The sputtered Al-0.11 wt.% Sc film performed much better than any of the other two regarding the characterizations concerned. Examining through AFM, the sputtered Al-0.11 wt.% Sc revealed better surface property (including flatness and smoothness) than the others. Excellence in surface properties and optical reflectivity for the Al-0.11 wt.% Sc may arise from grain refinement in the film. Under long-term illumination, the films led to grain growth and hillocks formation. This illumination aging degraded the surface properties and optical reflectivity of the films, especially for the pure Al films. The sputtered Al-0.11wt.%Sc revealed more corrosion-resistance than the other films in 5% NaCl solution regardless whether or not under illumination aging. (C) 2009 Elsevier B.V. All rights reserved.
關聯:	THIN SOLID FILMS
显示于类别:	[機械工程研究所] 期刊論文

文件中的档案:

档案	描述	大小	格式	浏览次数
index.html		0Kb	HTML	535	检视/开启

在NCUIR中所有的数据项都受到原著作权保护.

社群 sharing

数据加载中.....