English  |  正體中文  |  简体中文  |  Items with full text/Total items : 69937/69937 (100%)
Visitors : 23037332      Online Users : 338
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version

    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/27768

    Title: A Bayesian Zero-failure Reliability Demonstration Test of High Quality Electro-explosive Devices
    Authors: Fan,TH;Chang,CC
    Contributors: 統計研究所
    Date: 2009
    Issue Date: 2010-06-29 19:33:12 (UTC+8)
    Publisher: 中央大學
    Abstract: Usually,for high reliability products the production cost is high and the lifetime is much longer, which may not be observable within a limited time. In this paper, all accelerated experiment is employed in which the lifetime follows all exponential distribution with the failure rate being related to the accelerated factor exponentially. The underlying parameters are also assumed to have the exponential prior distributions. A Bayesian zero-failure reliability demonstration test is conducted to design forehand the minimum sample size and testing length subject to a certain specified reliability criterion. Probability of passing the test design as well as predictive probability for additional experiments is also derived. Sensitivity analysis of the design is investigated by a simulation study. Copyright (C) 2009 John Wiley & Sons, Lid.
    Appears in Collections:[統計研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat

    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明