HIGHER-ORDER ANALYSIS OF 4-BEAM CROSS GRATING INTERFEROMETERS

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題名:	HIGHER-ORDER ANALYSIS OF 4-BEAM CROSS GRATING INTERFEROMETERS
作者:	CHENG,YS
貢獻者:	光電科學研究所
關鍵詞:	FRINGE FORMATION
日期:	1991
上傳時間:	2010-06-29 19:45:29 (UTC+8)
出版者:	中央大學
摘要:	Both on- and off-axis four-beam interference patterns are analyzed using ray tracing. The cross gratinglike interference pattern is accompanied by an extra term which consists of two orthogonal two-beam interference patterns. When partially coherent light is used, the extra term generally degrades the contrast of the cross gratinglike pattern unless some special kinds of source are utilized. With gratings of high spatial frequencies, the amplitude of the extra term can become large compared with the desired term. Consequently, the localized cross gratinglike pattern is changed to be periodic in different directions.
關聯:	APPLIED OPTICS
顯示於類別:	[光電科學研究所] 期刊論文

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