PROFILE MEASUREMENT OF AN ASPHERIC CYLINDRICAL SURFACE FROM RETROREFLECTION

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題名:	PROFILE MEASUREMENT OF AN ASPHERIC CYLINDRICAL SURFACE FROM RETROREFLECTION
作者:	LIN,DT;WAN,DS
貢獻者:	光電科學研究所
日期:	1991
上傳時間:	2010-06-29 19:45:31 (UTC+8)
出版者:	中央大學
摘要:	A new algorithm for measuring the profile of an aspheric cylindrical surface is developed in which directions of the surface normal and slopes at various locations are found with the aid of a retroreflected beam. The locations of retroreflection can be found with the simple algorithm developed in this paper, and the surface profile is integrated from the slope. The accuracy of the new algorithm is determined mostly by the algorithm's ability to find the true range of the surface being integrated. In the measurement of the surface sagitta over the range of 5000-mu-m, the accumulated error from the integration is less than 30-mu-m.
關聯:	APPLIED OPTICS
顯示於類別:	[光電科學研究所] 期刊論文

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