Surface photovoltage spectroscopy characterization of a GaAs/GaAlAs vertical-cavity-surface-emitting-laser structure: Angle dependence

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Title:	Surface photovoltage spectroscopy characterization of a GaAs/GaAlAs vertical-cavity-surface-emitting-laser structure: Angle dependence
Authors:	Liang,JS;Huang,YS;Tien,CW;Chang,YM;Chen,CW;Li,NY;Li,PW;Pollak,FH
Contributors:	電機工程研究所
Keywords:	PHOTOMODULATED REFLECTANCE;PHOTOREFLECTANCE
Date:	2001
Issue Date:	2010-07-06 18:34:46 (UTC+8)
Publisher:	中央大學
Abstract:	An angle-dependent surface photovoltage spectroscopy (SPS) study has been performed at room temperature on a GaAs/GaAlAs-based vertical-cavity-surface-emitting-laser (VCSEL) structure emitting at a wavelength near 850 nm. For comparison purposes, we have
Relation:	APPLIED PHYSICS LETTERS
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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