中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Item 987654321/34344
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 80990/80990 (100%)
Visitors : 41650044      Online Users : 1325
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/34344


    Title: Nanoscale measurements of conducting domains and current - Voltage characteristics of chemically deposited polyaniline films
    Authors: Wu,CG;Chang,SS
    Contributors: 化學研究所
    Keywords: ATOMIC-FORCE MICROSCOPY;SELF-ASSEMBLED MONOLAYERS;SCANNING ELECTROCHEMICAL MICROSCOPY;TO-METAL TRANSITION;MOLECULAR ELECTRONICS;TUNNELING-MICROSCOPY;DOPANT DISTRIBUTION;CHARGE-TRANSPORT;POLYPYRROLE;POLYMERS
    Date: 2005
    Issue Date: 2010-07-07 12:02:37 (UTC+8)
    Publisher: 中央大學
    Abstract: Spatial variations in electric conductivity and evolutions of band structures of polyaniline (PANI) films have been studied by use of a so-called current-sensing atomic force microscope (CS-AFM) or atomic force microscope current image tunneling spectrosc
    Relation: JOURNAL OF PHYSICAL CHEMISTRY B
    Appears in Collections:[Graduate Institute of Chemistry] journal & Dissertation

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML351View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明