Determination of retardation parameters of multiple-order wave plate using a phase-sensitive heterodyne ellipsometer

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/35251

Title:	Determination of retardation parameters of multiple-order wave plate using a phase-sensitive heterodyne ellipsometer
Authors:	Hsieh,Cheng-Hung;Tsai,Chien-Chung;Wei,Hsiang-Chun;Yu,Li-Ping;Wu,Jheng-Syong;Chou,Chien
Contributors:	光電科學與工程學系
Keywords:	ELLIPTIC BIREFRINGENCE;OPTICAL-PARAMETERS;FILTER;AXIS
Date:	2007
Issue Date:	2010-07-07 14:07:58 (UTC+8)
Publisher:	中央大學
Abstract:	To characterize the linear birefringence of a multiple-order wave plate (MWP), an oblique incidence is one of the methods available. Multiple reflections in the MWP are produced, and oscillations in the phase retardation measurement versus the oblique inc
Relation:	APPLIED OPTICS
Appears in Collections:	[Department of Optics and Photonics] journal & Dissertation

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