Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis

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題名:	Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis
作者:	Chyou,Jin-Jung;Chu,Chih-Sheng;Chien,Fan-Ching;Lin,Chun-Yu;Yeh,Tse-Liang;Hsu,Roy Chaoming;Chen,Shean-Jen
貢獻者:	光電科學與工程學系
關鍵詞:	BIOSENSORS;FILMS;SPECTROSCOPY;METROLOGY;SENSORS
日期:	2006
上傳時間:	2010-07-07 14:10:47 (UTC+8)
出版者:	中央大學
摘要:	Surface plasmon resonance (SPR) sensing and an enhanced data analysis technique are used to obtain precise predictions of the dielectric constant and thickness of a nanolayer. In the proposed approach, a modified analytical method is used to obtain initia
關聯:	APPLIED OPTICS
顯示於類別:	[光電科學與工程學系] 期刊論文

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