Investigation of degradation for ohmic performance of oxidized Au/Ni/Mg-doped GaN

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/35432

Title:	Investigation of degradation for ohmic performance of oxidized Au/Ni/Mg-doped GaN
Authors:	Lin,YJ;Li,ZD;Hsu,CW;Chien,FT;Lee,CT;Shao,ST;Chang,HC
Contributors:	光電科學與工程學系
Keywords:	P-TYPE GAN;CONTACTS
Date:	2003
Issue Date:	2010-07-07 14:14:39 (UTC+8)
Publisher:	中央大學
Abstract:	The mechanism of ohmic contact degradation for the oxidized Au/Ni/Mg-doped GaN under various annealing times has been investigated. According to the results from x-ray photoelectron spectroscopy and the Cserveny's concept, we found that an increase of hol
Relation:	APPLIED PHYSICS LETTERS
Appears in Collections:	[Department of Optics and Photonics] journal & Dissertation

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