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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/35625


    Title: Structures of Co and Pt nanoclusters on a thin film of Al2O3/NiAl(100) from reflection high-energy electron diffraction and scanning-tunnelling microscopy
    Authors: Luo,M. F.;Wen,W. H.;Lin,C. S.;Chiang,C. I.;Sartale,S. D.;Zei,M. S.
    Contributors: 奈米科技研究中心
    Keywords: OXIDE-FILMS;GROWTH;AL2O3;CLUSTERS;ALUMINA;PHASE;NANOPARTICLES;NANOCRYSTALS;NIAL(001);OXIDATION
    Date: 2007
    Issue Date: 2010-07-07 15:45:47 (UTC+8)
    Publisher: 中央大學
    Abstract: With reflection high-energy electron diffraction (RHEED) and scanning-tunnelling microscopy (STM), we made measurements on Co and Pt nanoclusters grown by vapour deposition on a thin film of Al2O3/NiAl(1 00). The results show that the annealed Co nanoclus
    Relation: SURFACE SCIENCE
    Appears in Collections:[奈米科技研究中心 ] 期刊論文

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