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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/35701


    Title: Optical characterization studies of grown-in defects in ZnO epilayers grown by molecular beam epitaxy
    Authors: Wang,X. J.;Buyanova,I. A.;Chen,W. M.;Pan,C. J.;Tu,C. W.
    Contributors: 光電科學研究中心
    Keywords: MAGNETIC-RESONANCE;ESR-SPECTRA;EXCITON
    Date: 2007
    Issue Date: 2010-07-07 15:49:19 (UTC+8)
    Publisher: 中央大學
    Abstract: Defect formation in ZnO epilayers grown by molecular beam epitaxy (MBE) is studied by employing optical characterization techniques such as photoluminescence (PL) and optically detected magnetic resonance (ODMR). Excess of oxygen during the growth was fou
    Relation: PHYSICA B-CONDENSED MATTER
    Appears in Collections:[光電科學研究中心] 期刊論文

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