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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/39176


    Title: Energy straggling and multiple scattering in silicon strip detectors
    Authors: Anticic,T;Battiston,R;Braunschweig,W;Chang,YH;Chien,CY;Chen,AE;Hou,SR;Lin,CH;Lin,WT;Ostonen,R;Spartiotis,K;Syben,O;Toker,O;Wittmer,B
    Contributors: 物理研究所
    Date: 1996
    Issue Date: 2010-07-08 14:07:19 (UTC+8)
    Publisher: 中央大學
    Abstract: We present a test beam study of energy straggling and multiple scattering in silicon strip detectors using electrons and pions of momenta up to 50 GeV. Results are compared with GEANT simulation using a simple algorithm to parameterize energy loss distribution. The deflection due to multiple scattering in crystalline structure was investigated by placing a GaAs wafer at various angles.
    Relation: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    Appears in Collections:[物理研究所] 期刊論文

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