A STUDY OF THE CHARGE CLUSTER CHARACTERISTICS AND SPATIAL-RESOLUTION OF A SILICON MICROSTRIP DETECTOR

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/39209

Title:	A STUDY OF THE CHARGE CLUSTER CHARACTERISTICS AND SPATIAL-RESOLUTION OF A SILICON MICROSTRIP DETECTOR
Authors:	CHANG,YH;CHEN,AE;HOU,SR;LIN,WT
Contributors:	物理研究所
Date:	1995
Issue Date:	2010-07-08 14:08:21 (UTC+8)
Publisher:	中央大學
Abstract:	The analysis on test beam data of a large silicon microstrip detector is presented. The spatial resolution has been studied with full GEANT simulation to calculate the systematic uncertainty due to multiple scattering. Several cluster position-finding algorithms have been applied for inclined tracks. The cluster profile and spatial resolution have the predicted geometrical correlation to the track angle.
Relation:	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Appears in Collections:	[Graduate Institute of Physics] journal & Dissertation

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