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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/39222


    Title: DETERMINATION OF THE OPTICAL-CONSTANT PROFILES OF THIN WEAKLY ABSORBING INHOMOGENEOUS FILMS
    Authors: LIOU,YY;LEE,CC;JAING,CC;CHU,CW;HSU,JC
    Contributors: 物理研究所
    Keywords: REFRACTIVE-INDEX;THICKNESS
    Date: 1995
    Issue Date: 2010-07-08 14:08:47 (UTC+8)
    Publisher: 中央大學
    Abstract: The expression for the transmission of a thin weakly absorbing inhomogeneous film on a thick finite transparent substrate is manipulated to yield formulas for the refractive index and extinction coefficient. A procedure based on the envelope method is presented to determine the optical constant profile, the inhomogeneity, the mean refractive index, the degree of inhomogeneity, and the thickness of a film. Only the information contained in the trans mission monitoring curve is used and the process is simple, fast and can be easily carried out using a personal computer. The procedure presented in this paper can be used as a means of investigating the degree of inhomogeneity and the absorption of the films deposited by different coating methods and deposition conditions. It is shown that TiO2 him deposited on a heated substrate has a more desirable optical constant profile than one deposited on an unheated substrate. For ZrO2 him deposited on a heated substrate, the degree of inhomogeneity is greater whereas the absorption is lower than those of TiO2 films.
    Relation: JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    Appears in Collections:[物理研究所] 期刊論文

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