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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/47020

    Title: 運用角解析光電子能譜術來檢測與操控奈米結構的性質;Properties of Nanostructures Characterized and Manipulated with Angular-Resolved Photoelectron Spectroscopy
    Authors: 陸大安
    Contributors: 物理學系
    Keywords: 物理類
    Date: 2010-08-01
    Issue Date: 2011-07-13 16:23:54 (UTC+8)
    Publisher: 行政院國家科學委員會
    Abstract: 奈米結構的行為與它的電子結構有密切的關係。奈米結構的電子結構可透過改變它的大小與表面成份來修改。因此,要適切地去建造、檢測、與操控奈米結構,準確地測量奈米結構的電子結構是非常重要的。角解析光電子能譜術是量測材料電子結構最好的工具之一。在此研究計畫中,我們希望建造一個工作站,能在國家同步輻射研究中心中不同的光束線上進行角解析光電子能譜的測量。在我們的計畫執行完畢後,我們預期我們檢測奈米結構的能力將大幅增加,並對奈米結構的動態行為有新的想法。而這些能力與想法都將是建構新穎奈米結構的重要基礎。我們也相信此工作站在表面科學研究上將可彌補在台灣廣泛使用的掃描探針顯微術的不足。 How a nanostructure behaves is closely related to its electronic structure. One can modify the electronic structure of a nanostructure by varying its physical dimensions and surface composition. Therefore, to construct, characterize, and manipulate a nanostructure properly, it is crucial to measure its electronic structure accurately. The angle-resolved photoelectron spectroscopy (ARPES) is one of the best tools to determine the electronic state of material. Our research proposal is aimed to construct an endstation that can be installed on different beamlines at NSSRC to perform ARPES measurements. After the execution of our proposal, we expect to gain great capability to characterize many advanced nanostructures and insight into the dynamics on the surface of nanostructures. This ability will be the key to construct novel nanometer-size devices. We also believe that the proposed ARPES system will be a great complement to the scanning probe microscopy widely adapted in surface studies in Taiwan. 研究期間:9908 ~ 10007
    Relation: 財團法人國家實驗研究院科技政策研究與資訊中心
    Appears in Collections:[物理學系] 研究計畫

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