光致發光反應測量半導體元件之特點為非破壞、非接觸與快速，因此非常適合做為快速且大量之太陽能電池檢測方法。本計畫提出藉由高功率近紅外雷射作為幫浦光源，照射矽基太陽能電池，配合特殊波長濾鏡與高感度CCD 攝影機量測紀錄矽基太陽能電池之光致發光螢光空間分佈，藉以計算太陽能電池之物理、電子電路特性，包含額外載子密度、生命期、擴散長度、串聯電阻、橫向電阻、缺陷等空間分布，預計分三年度完成。這些物理電子電路參數以各種方式影響太陽能電池之效率、壽命，甚至影響模組內其他太陽能電池之表現。本計劃理論部份，包含建立完整載子物理模型、等效電路模型與兩者結合之模型，這些模型並不侷限於矽基太陽能電池而可適用於其他半導體材料之太陽能電池檢測應用；實驗部份包括光致發光系統架設、影像處理、程式撰寫。Photoluminescence is an important inspection method which is non-destructive, contactless and rapid. Therefore, it is ideal of rapid and large quantity solar cell inspection. This project will use high power near IR laser as the pump light source to illuminate Si-based solar cell. Utilizing specially designed filter and highly sensitive CCD camera, we will record the spatial distribution of the photoluminescence signal emitted from the solar cell. Based on the image recorded, the physical, electronic and circuitry properties of the solar cell can then be calculated. These properties include excess carrier density, lifetime, diffusion length, serial resistance, transverse resistance, and defect spatial distribution inside the solar cell measured. This entire project will take 3 years to be accomplished. These physical, electronics and circuitry properties influence the efficiency and lifespan of the solar cell and even other solar cells’ performances in a module in various aspects. The theoretic part of this project include the establishment of complete carrier physics model, equivalent circuit model and the combination of these two models. These models will not be limited to Si-based solar cell and can be applied to other semiconductor based solar cell inspection application. The experimental part of this project include the photoluminescence system setup, image processing and the programming. 研究期間：10008 ~ 10107
