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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/50964


    Title: Digital circularly polarized heterodyne ellipsometer
    Authors: Yu,CJ;Chang,JG;Lin,CE;Lee,CC;Chou,C
    Contributors: 光電科學與工程學系
    Keywords: INTERFEROMETRIC ELLIPSOMETRY;2-FREQUENCY LASER;MODULATOR;SYSTEMS
    Date: 2010
    Issue Date: 2012-03-27 18:14:03 (UTC+8)
    Publisher: 國立中央大學
    Abstract: In this research, a digital circularly polarized heterodyne ellipsometer (DCPHE) is developed, which has a heterodyne interferometer based on a dual-frequency paired circularly polarized laser beam integrated with a digital storage oscilloscope. DCPHE is an amplitude-sensitive ellipsometer that is applicable to real time and precise measurement of ellipsometric parameters. The systematic errors are likewise derived and analyzed. When the incident angle alpha are set at 60 degrees and 70 degrees in DCPHE. an accuracy of less than 0.7% of the ellipsometric parameter measurement of the SiO(2) thin film deposited on silicon substrate is achieved. (C) 2009 Elsevier B.V. All rights reserved.
    Relation: THIN SOLID FILMS
    Appears in Collections:[光電科學與工程學系] 期刊論文

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