無鉛銲料與添加鈀層之無電鍍鈷基材界面反應研究; Massive spalling and morphological change of intermetallic compound affected by adding Pd in Co-based surface ?nishes

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題名:	無鉛銲料與添加鈀層之無電鍍鈷基材界面反應研究;Massive spalling and morphological change of intermetallic compound affected by adding Pd in Co-based surface ?nishes
作者:	洪嘉宏;Hong,Jia-hong
貢獻者:	化學工程與材料工程學系
關鍵詞:	無鉛銲料;界面反應;無電鍍鈷;無電鍍鈀;大規模剝離;界面能;Pb-free solder;interfacial reaction;electroless cobalt;electroless palladium;massive spalling;interfacial energy
日期:	2013-07-30
上傳時間:	2013-08-22 11:39:07 (UTC+8)
出版者:	國立中央大學
摘要:	本研究主要討論Sn-3.0Ag-0.5Cu銲料分別與四種無電鍍鈷系統之界面反應，並探究其表面形貌之改變與相變化。此無電鍍鈷系統包含無電鍍鈷(Electroless Cobalt，EC)、無電鍍鈷/浸金(Electroless Cobalt/Immersion Gold，ECIG)、無電鍍鈷/無電鍍鈀(Electroless Cobalt/Electroless Palladium，ECEP)及無電鍍鈷/無電鍍鈀/浸金(Electroless Cobalt/Electroless Palladium/Immersion Gold，ECEPIG)等，其中無電鍍鈷層內含有磷及微量的鎢元素，即Co(W,P)。實驗結果顯示，系統添加鈀層之後，不僅改變介金屬化合物之表面形貌，更引致(Co,Cu,Pd)Sn3發生大規模剝離。在Co(W,P)消耗完之後的迴銲過程，高的界面能及厚的介金屬化合物，造成(Co,Cu,Pd)Sn3內部產生壓應力。因此，藉由彎曲釋放內部壓應力，可能為引致(Co,Cu,Pd)Sn3發生大規模剝離之驅動力。 This study investigates the interfacial reactions and microstructures of SAC305 solders on four different Co-based surface finishes, electroless Co(W,P) (EC), electroless Co(W,P)/immersion Au (ECIG), electroless Co(W,P)/electroless Pd (ECEP), and electroless Co(W,P)/electroless Pd/immersion Au (ECEPIG). The evolution of microstructure at different reflow conditions revealed that Pd layer not only changed the morphology of the intermetallic compound but also generated higher interfacial energy between solders and Co-based substrates. High interfacial energy and thick reaction phase could induce compressive stress within the (Co,Cu,Pd)Sn3 layer during the reflow process after exhausting Co(W,P). The reduction of the stress could be the possible driving force for massive spalling of the (Co,Cu,Pd)Sn3 intermetallic compound.
顯示於類別:	[化學工程與材料工程研究所] 博碩士論文

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