研究期間：10108~10207;It is well known that anodic aluminum oxide film (AAO) mainly contains amorphous alumina. Recent researches found that the AAO film also contains some boehmite (AlOOH). This study intend to use X-ray photoelectron spectroscopy (XPS) to analyzed the constituent oxides and phases in the AAO film that formed in the short time on the high pure Al sample. Effect of SO4 2- and C2O4 2- ions on the constituent oxides and phases will be fully explored and discussed in this study. During anodization, the SO4 2- ions that moved from electrolyte and affected by the field potential in the pore channel would transfer to SO3 at the pore base. The SO3 is gas phase and intends to form nano-bubble at the pore base. When the SO3 nano-bubbles contact with H2O, they would react to form aqueous solution. Parts of SO4 2- ions would like to react with Al(OH)3 oxide to form aluminum sulfate. The functions of C2O4 2- ions in the oxalic solution are similar to that of SO4 2- ion in sulfuric solution. This study plans to use high purity aluminum (99.999%) and anodize in 1) sulfuric solution and 2) oxalic solution. During anodization, the SO4 2- ions and C2O4 2- ions would migrate to film/metal interface to react with amorphous alumina, Al(OH)3 and AlOOH oxides to get various reactants. Effect of above reactions on the constituent phases is significant and worth of study. After XPS analyze, the AAO films would be removed for measuring the refractive index and extinction coefficient. Relation of constituent phases and oxides in the AAO film with the reflective index and extinction coefficient would be correlated and discussed.