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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/68173

    Title: 研究TIEGCM的環境控制參數於電離層電子濃度分布之敏感度分析;Sensitivity of electron density distribution response to TIEGCM environment driving parameter
    Authors: 趙士豪;Chao,Shih-hao
    Contributors: 太空科學研究所
    Keywords: 電離層;電子濃度
    Date: 2015-08-25
    Issue Date: 2015-09-23 10:50:48 (UTC+8)
    Publisher: 國立中央大學
    Abstract: 使用 TIEGCM 模擬 2008 年第 80 天的電子濃度,針對太陽紫外線輻射
    之結構影響。;We use TIEGCM to simulate the electron density on
    the 80th day of 2008, and make comparisions of
    electron density with and without adjustments on solar
    EUV flux, cross polar-cap potential, hemisphere power,
    dayside and nightside ion flux at upper bound, and
    amplitude and phases of atmosphere tides. Discuss the
    sensitive regions or high electron density structures
    for each parameter we adjust.
    Appears in Collections:[太空科學研究所 ] 博碩士論文

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