English  |  正體中文  |  简体中文  |  Items with full text/Total items : 65421/65421 (100%)
Visitors : 22277059      Online Users : 201
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/68340


    Title: 多波長光強度傳播方程之相位成像;Transport of intensity equation from different wavelengths for quantitative phase imaging
    Authors: 林晟;Lin,Cheng
    Contributors: 光電科學與工程學系
    Keywords: 相位成像;強度傳播方程;phase image;Transport of intensity equati
    Date: 2015-08-18
    Issue Date: 2015-09-23 11:27:44 (UTC+8)
    Publisher: 國立中央大學
    Abstract: 目前,顯微影像的技術,已經能夠呈現一般顯微鏡無法達到的高對比度影像效果。事實上,早在1953年時, 由諾貝爾獎得主Zernike所發明的相位差(phase contrast)顯微鏡,便成功的征服這個問題。但是,無法定量卻是最大罩門。近年來,有許多論文所討論的強度傳輸方程(Transport of intensity equation, TIE)相位成像,就是一種非干涉式、量測容易,而且有即時量測可能性的定量相位成像技術。本文將在這些研究的基礎上,達成比一般TIE定量更準確,且有及時相位成像可行性的多波長光強度傳播方程。當然,在研究過程中,除了藉由模擬不同的雜訊影響程度,分析得到最佳離焦距離。又在雙色TIE的部分,設計方程式推導定量計算並驗證。更進一步,在現有的技術上,推導出同時具有雙色TIE,與高階TIE優勢的多波長TIE 。最後在實驗上,我們達成傳統TIE、高階TIE與彩色TIE 的定量相位重建。;Microscopy can be utilized to observe biological samples, but conventional wide-field microscopy cannot obtain phase information. Phase contrast microscopy has been invented by Zenike at 1953 to improve the contrast of samples. Although a phase contrast microscope can significantly enhance the contrast of fine features, in general it cannot obtain the quantitative information from a biological objects. Transport of intensity equation (TIE) is a unique technique for phase imaging. Unlike phase contrast microscopy, it acquires quantitative phase information of samples. Here, we apply TIE with multiple wavelengths to reconstruct quantitative phase imaging. In our measurements TIE imaging with multiple wavelengths can retrieve quantitative phase information of fine features of sample in a fast fashion without scanning and has better quality than traditional TIE , also has real time possibility.
    Appears in Collections:[光電科學研究所] 博碩士論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML281View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明