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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/68686

    Title: 液晶面板色不均瑕疵消除及批量處理研究;Study on De-mura and Batch Run for TFT-LCD
    Authors: 李明峰;Li,Ming-feng
    Contributors: 資訊工程學系在職專班
    Keywords: 液晶面板;色不均瑕疵消除;批量處理;共通補償值;TFT-LCD panel;de-mura;batch run;common code;H and V values
    Date: 2015-07-24
    Issue Date: 2015-09-23 14:07:05 (UTC+8)
    Publisher: 國立中央大學
    Abstract: 本論文研究主要是探討液晶面板模組,在製程中所產生之色不均瑕疵 (mura) 的消除;再利用消除色不均瑕疵系統重覆做影像擷取、影像校正、產生燒錄檔、燒錄資料、影像比對的循環校正,並探討液晶面板中的色不均瑕疵圖像資料或製程上是否有相關性,是否可依照相同關係或特性來做批量的處理直接燒錄補償值;例如,影像的亮度比對、生產製程資料比對,來找出共同可接受的燒錄補償值來做色不均瑕疵校正。
    液晶面板色不均瑕疵長久以來都是影響畫質均勻性的一項顯著因素,而且現在為了滿足客戶的需求,大尺寸液晶面板製程對整體的畫面均勻性更為顯著,色不均瑕疵的消除也更加重要。本實驗針對液晶面板的特性與製程資料收集,產生一個共用燒錄補償值 (common code),直接燒錄到液晶面板上的快取記憶體來做色不均瑕疵消除校正,再大量的驗證,確認色不均瑕疵消除的程度,以恰好可辨識強度差 (just noticeable distortion, JND) 數值與水平-垂直資訊互相差異的程度數值 (H V-value)判定,另再確認迦瑪值 (Gamma value) 光學是否有影響。
    實驗以取得先前同一批的液晶面板影像約100 ~ 130片資訊,將這些資訊以每的像素灰階做平均值 (mean)、去除離異值 (outlier-mean)、中位數 (median)、眾數 (mode) 換算出共通的特點當作基準共通補償值 (common code),再以實際給約100片的液晶面板批量驗證處理的情況下,其水準影像水平資訊互相差異的程度數值約為26 ~ 24,垂直影像資訊互相差異的程度數值約為14 ~ 10,為顯著的差異修正。
    ;In Thin-Film Transistor Liquid Crystal Display (TFT-LCD) panel module manufacturing process, how to repair mura defect, make use of the gets rid of the mura defect system (De-Mura) to again do the catch image, Image region of interest (ROI), the creation de-mura repair code and burn to record the de-mura process procedure that the datas, images to compare right of again repair, and inquire into image information or the manufacturing process last relativity of mura defect in TFT-LCD, whether the processing that can do a batch quantity according to same relation or characteristic directly burns to record to compensate the value, for example: ratio to image and production manufacturing process data, calculate the value (common code) to do the de-mura.
    Mura defect of TFT-LCD panel for long time for influence the even of quality as an important factor, and now for satisfying the customer′s need, big size TFT-LCD panel, the manufacturing process that de-mura is also more important. The experiment characteristic aiming at TFT-LCD panel and manufacturing process data collections produce a common code burn to record in the panel of take a flash IC to do De-Mura, again effect of a great deal of identification confirmation de-mura, the use just noticeable distortion (JND) value and degree number of image information mutual difference of horizontal-vertical direction (H and V values) to judge, another confirm the gamma value optics whether have the influence.
    Experiment with the TFT-LCD panel that obtains in times before the same batch image about 100 ~ 130 pcs of information, these information with each of pixel bright degree operation of the use mean, outlier-mean, median and mode, calculate the common code, use 100 pcs of TFT-LCD panel again to in great quantities identify (batch run). The degree number of image information mutual difference of horizontal direction (H value) is about 26 ~ 24, vertical direction (V value) is about 14 ~ 10, this method is obvious improvement.
    Appears in Collections:[資訊工程學系碩士在職專班 ] 博碩士論文

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