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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/72923


    Title: 非破壞性暗鎖相熱成像法應用在太陽能電池串聯電阻空間分布之研究;Evaluation of the spatial distribution of series resistance of a solar cell using dark lock-in thermography
    Authors: 王种皓;Wang, Chung-Hao
    Contributors: 光電科學與工程學系
    Keywords: 暗鎖相熱成像法;太陽能電池;串聯電阻
    Date: 2017-01-25
    Issue Date: 2017-05-05 17:16:56 (UTC+8)
    Publisher: 國立中央大學
    Abstract: 在本論文中,運用了熱傳學的熱擴散方程式(Heat diffusion equation)與非接觸式的暗鎖相熱成像法(Dark Lock-in Thermography, 簡稱為DLIT)兩套理論,配合上太陽能電池的等效電路模型,建立出一套計算太陽能電池串聯電阻與並聯電阻二維空間分布的物理模型;而在這套模型的使用上,藉由實驗量測分析所得到的結果來應證模型的準確度,最終求得太陽能電池串聯電阻阻值的空間分布;另外也有做模擬結果與實驗結果在趨勢上的比對。;In this paper, a physical model which can calculate the series and shunt resistance spatial distribution of solar cell is established. It derives from the heat diffusion equation and the non-contact Dark Lock-in Thermography (DLIT) with an equivalent circuit model of solar cell. In the use of this physical model, the accuracy of the physical model is verified by the experiment measurement and analysis, Finally, the spatial distribution of series resistance of the solar cell is obtained. In addition, there is a comparison between the trend of experiment and simulation results.
    Appears in Collections:[光電科學研究所] 博碩士論文

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