本論文提出一套操作步驟較為簡潔的新式全像形變量測技術：「光致變色式全像干涉術形變量測系統」。研究中我們以全像拍攝的方式量測高反射率鏡面物體與低反射率粗糙物體的形變，將變化前後之波前資訊以紫光雷射(405 nm)記錄於光致變色材料上。其中高反射率鏡面物體形變量測實驗的條紋靈敏度為362.3 nm/條，而低反射率粗糙物體形變量測實驗的條紋靈敏度為1.029 μm/條。有別於傳統的部分是其不需要將記錄媒體取下進行顯影、定影、清洗、風乾等繁瑣步驟，曝光後即可直接重建出物體影像，此外遮蔽光源後即可洗去全像光柵，每次量測完成，不需要更換記錄媒體，可以重複使用。;We proposed a simpler and newer deformation measurement system by photochromic material-based holographic interferometry. In this research, we measured deformation from high reflectivity object and low reflectivity object, the wave information recorded on photochromic material by purple laser (405 nm). The sensitivity is 362.3 nm in the high reflectivity object deformation measurement experiment, and the sensitivity is 1.029 μm in the low reflectivity object deformation measurement experiment. Different from tradition, the process is no need to remove the photochromic material to development, fixing, cleaning, air drying and any other steps, it can directly reconstruct the object image after exposure. In addition, the holographic grating can be erased after shielding the light source. Every time we completed the measurement, there is no need to change the recording media. It can be reused.
