為量測電離層中大氣暉光，本實驗室開發了以光電倍增管為感測器，用微控制器做為核心的氣暉剖面儀。然而在對光電倍增管做各別校正時，發現以原有的氣暉剖面儀電路，在量測光源強度較高時，會使倍增管的量測範圍受限，於是本論文提出兩個可能有效的方法改進原有設計，一為調動供應給光電倍增管之高壓電，一為調動倍增管脈衝訊號處理電路中之偏壓，並進行實驗。因此設計新的氣暉剖面儀，和整合相關的校正平台，結果顯示，氣暉剖面儀將可透過自適應控制，配合光電倍增管供應電壓改變的方式來將原本1300pW的量測光強度範圍擴大到4700pW。;In order to measure the airglow in the ionosphere, our laboratory developed a photo-tomograph instrument . The instrument, taking micro-controller as control unit, count the pulse from photomultiplier tube. During calibrating the photomultiplier tube, it is found that the original circuit design of the photo-tomograph instrument restricts the measurement range. To resolve the restriction , two approachs are conduct to improve the original design. A new design of the photo-tomograph instrument, and its reintegrated calibration platform of photomultiplier tube are accomplished. Result show that the measurement intensity range can be expended by the adaptive control together, with change to the photomultiplier supply voltage .
