English  |  正體中文  |  简体中文  |  Items with full text/Total items : 66984/66984 (100%)
Visitors : 22976302      Online Users : 400
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version

    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/79467

    Title: 中小型光學鏡組之高密度全場波前量測;The high resolution full field wavefront measurement of a misaligned miniature lens
    Authors: 張鴻聖;Hung-Sheng, Chang
    Contributors: 光電科學與工程學系
    Keywords: 波前檢測器;光學鏡頭;全場像差;wavefront sensor;full field aberration;miniature lens
    Date: 2019-01-29
    Issue Date: 2019-04-02 14:28:52 (UTC+8)
    Publisher: 國立中央大學
    Abstract: 成像光學系統的檢測,在現今的產業界中,缺乏一個完善的檢測儀器,針對光學系統中的各種製造誤差進行有效率的量測.光學系統的製造誤差包含了單一元件的偏心、傾角誤差與厚度誤差,以及各元件之間的偏心誤差、傾角誤差與距離誤差.現有的量測儀器中,包含了探針式表面輪廓儀、干涉儀、自準直儀與MTF檢測儀等,這些儀器均無法有效率且完整的檢測各種系統中的製造誤差.
    ;Compared with the industry standard MTF consequential testing result, the full field transmitted wavefront testing is more analytical for field aberration analysis. A novel wavefront measuring device specialized for the miniature lens testing application is developed to measure the full field aberration in a high resolution of 35x36 radial-azimuthal fields. The device adapts the high dynamic range Shack-Hartman wavefront sensor to minimize the alignment uncertainty induced from collimator under high field angle.
    The plane symmetrical aberration due to elements misalignment are identified and quantified throughout the measured field. The resulting aberration field is therefore simply a combination of plane symmetric aberrations that do not necessarily share the same orientation for their respective plane of symmetry. The theory that describes the aberration of imaging optical system without symmetry including the effects of fabrication and assembly errors. As a result, the misaligned lens element inside lens barrel or the centering error of each single element induce the plane symmetric optical aberration throughout the optical field.
    The field constant coma and field linear astigmatism contributes most aberration errors to the edge of the field as expected. Through the field dependent aberration analysis. this device proves that the miniature lens image quality near the edge of the field is practically limited by the misalignment of the optical elements.
    Appears in Collections:[光電科學研究所] 博碩士論文

    Files in This Item:

    File Description SizeFormat

    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明