對稱型嵌段高分子聚(苯乙烯-b-甲基丙烯酸甲酯)與均聚物聚苯乙烯之雙成份混摻薄膜分別錨定在經表面改質之中性基材與選擇性基材上，將其進行熱退火，自組裝後之結構形態利用原子力顯微鏡(AFM)與低掠角式小角度散射儀(GISAXS)深入分析探討。我們發現在弱偏析分離強度區域(Weak segregation strength regime)，不同的均聚物混摻比例下得到許多種奈米微結構，例如: 穿孔層(Perforated Layer)、雙連續螺旋相(Bicontinuous- Double Gyroid) 、體心立方堆積(Body-centered cubic)等特殊結構，且觀察到在薄膜均聚物混摻系統中相變化之現象受到不同的混摻組成、分子量大小和不同厚度的影響。;Thin film nanostructures of binary mixtures of (polystyrene-block-polymethyl methacrylate) (PS-b-PMMA) diblock copolymer and homopolymer polystyrene supported on a neutral or selective substrate were investigated. Effects of compositions and molecular weights of added PS in the mixtures on the morphology of self-assembly in thin films were studied by grazing-incidence small-angle X-ray scattering (GISAXS) and atomic force microscopy (AFM). In the weak segregation strength region, several unique morphologies, such as body-centered-cubic (BCC) packed, perforated layers and gyroids, were obtained. The unique morphologies were found to strongly depend on blending compositions and film thickness.
