小型電離層探測儀實驗室電漿注入測試;Plasma Injection Test on Compact Ionospheric Probe

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題名:	小型電離層探測儀實驗室電漿注入測試;Plasma Injection Test on Compact Ionospheric Probe
作者:	馮佳音;Feng, Chia-Yin
貢獻者:	太空科學研究所
關鍵詞:	小型電離層探測儀;電漿注入測試;CIP
日期:	2021-07-20
上傳時間:	2021-12-07 11:20:28 (UTC+8)
出版者:	國立中央大學
摘要:	小型電離層探測儀（Compact Ionospheric Probe, CIP）是一個多功能合一且具立方級大小的探測儀，用於實地量測電離層電漿參數與特性，可獲得電子溫度、離子溫度、離子密度、離子成分、離子速度等資訊。CIP是福衛五號科學酬載－先進電離層探測儀(Advanced Ionospheric Probe, AIP)的改良與縮小版，減少了重量與體積，能讓CIP有更多機會放在衛星執行科學任務。CIP發展多年至今，硬體部分已經完備，但在讀取資料部份仍有許多錯誤，因此本論文針對CIP的資料讀取韌體部份加以討論與修正錯誤。錯誤的部份如時脈的歸零和同步問題、先進先出（First In First Out, FIFO）演算使用問題、探測器的四個收集板資料讀取問題、PLP和RPT模式下掃描電位對科學資料造成的影響探討與修正。最後將修正後的CIP放入實驗室的太空電漿艙中模擬太空環境，進行電漿注入測試。其結果可確定CIP可提供穩定度高且可信任的資料和量測結果。;The Compact Ionospheric Probe (CIP) is an all-in-one and cube size detector which aims to measure the in-situ plasma characteristic and parameters in ionosphere. Electrical velocity, ion velocity, ion concentration, ion composition and inflow angle can be derived from the measurement data. CIP is an improved and smaller version of the Advanced Ionospheric Probe (AIP). Because of the reduction in size of volume and weight, it is more conductive to placing on different sizes of satellites. After years of hard work, the hardware of CIP is completion. However, there are some problems still contain in the data processing. Therefore, this paper discusses and corrects errors in the software and firmware of CIP data processing. Errors such as clock zeroing and synchronization problems, First-In-First-Out (FIFO) intellectual property core (IP core) using problem in software, the problem of reading data from the four collection boards of the detector, and the impact of sweeping potential on scientific data in PLP and RPT modes. Finally, the corrected CIP was put into the space plasma chamber of the laboratory to simulate the space environment, and the plasma injection test was performed. As a result, it can be determined that CIP is highly stable and reliable data.
顯示於類別:	[太空科學研究所 ] 博碩士論文

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