English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 80990/80990 (100%)
造訪人次 : 42119258      線上人數 : 1306
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/85941


    題名: 寬能隙氮化物半導體裡的自由電洞;Free Holes in Wide-bandgap Nitride Semiconductors
    作者: 張雅茜;Chang, Ya-Chien
    貢獻者: 光電科學與工程學系
    關鍵詞: 自由電洞;二維電洞氣;N型半導體;free holes;two dimensional hole gas;2DHG;N-type semiconductor
    日期: 2021-07-21
    上傳時間: 2021-12-07 11:44:06 (UTC+8)
    出版者: 國立中央大學
    摘要: 深紫外發光二極體(deep ultraviolet light-emitting diodes, DUV LEDs, 波長 ? 290 nm)需要高穿透、高導電的P型寬能隙半導體,才能發出更多的DUV光子。目前,多數團隊使用氮化鎵(GaN)或氮化鋁鎵(AlGaN)作為P型接觸層。然而,GaN的能隙(3.4 eV)太小,會吸收波長短於 360 nm 的深紫外光;AlGaN雖然能隙較大(3.4-6.1 eV),可減緩吸光,但是卻有低導電的問題。為了解決穿透率與導電度之間的兩難,我們嘗試以高能隙、高導電的N型 AlGaN (n-AlGaN),利用在 n-AlGaN/Ni 介面形成的二維電洞氣(Two-dimensional hole gas, 2DHG),來製作高穿透、高導電的P型接觸層。
    在本研究中,我們還以Ni/Al取代Ni/Au、Ti/Al取代Ti/Au。我們利用高真空電子束暨熱阻式蒸鍍系統 (E-gun/Thermal),在n-AlGaN磊晶層上蒸鍍不同的金屬電極,比較其光電特性。根據霍爾量測的結果,鍍上Ni/Al的N型Al0.3Ga0.7N可產生穩定的電洞訊號,且電洞遷移率可達10.4 cm2/V?s。由於Ni/Al在N型半導體表面會形成蕭特基介面,可累積高濃度的電洞,從而形成2DHG。我們也將2DHG的技術應用在n-Al0.7Ga0.3N/MQW的結構上,利用電激發得到 330 nm 的紫外光訊號。未來,我們將持續優化Ni/Al的製程條件,希望能有效提升DUV LED的發光效率。
    ;Deep ultraviolet light-emitting diodes (DUV LEDs, λ ? 290 nm) require high-transparent and high-conductive p-type semiconductor to produce adequate photons. P-type gallium nitride (p-GaN) or aluminum gallium nitride (p-AlGaN) are currently the most used contact layer for p-type electrodes. Nevertheless, p-GaN suffers severe UV absorption owing to her small bandgap (3.4 eV). Although the absorption issue can be alleviated by p-AlGaN with larger bandgaps (3.4-6.1eV), increasing the aluminum content in p-AlGaN leads to low conductivity. To circumvent the trade-off between transparency and conductivity faced by p-AlGaN, we propose a two-dimensional hole gas (2DHG) induced at the n-AlGaN/Ni interface.

    In this study, the p-type metal electrodes of Ni/Au and Ti/Au were replaced with Ni/Al and Ti/Al. In order to evaluate the electrical properties, the Al-based alloy was deposited by a high-vacuum electron-beam/thermal evaporation. We obtained the hole mobility of 10.4 cm2/V?s and a stable hole concentration, by the Hall measurement performed on the Al/Ni/n-Al0.3Ga0.7N structure. The result was attributed to the Schottky contact formed at the Ni/n-AlGaN interface, whose upward band bending traps high concentration of free holes. We also grew the 2DHG structure on an AlGaN-based quantum wells and obtained a 330 nm emission peak in electroluminescence spectra. The concept presented in this study has the potential to enhance the external quantum efficiency of DUV LEDs.
    顯示於類別:[光電科學研究所] 博碩士論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML88檢視/開啟


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明