博碩士論文 90226017 詳細資訊




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姓名 林秉勳(Ping-Hsun Lin)  查詢紙本館藏   畢業系所 光電科學與工程學系
論文名稱 X光高反射鏡之製鍍與分析
(Fabrication and Analysis of Soft X-Ray Mirror)
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摘要(中) 近垂直X光高反射鏡是發展X光光學研究的一個關鍵元件。在波長為13.4nm的軟X光波段,鉬和矽由於其材料特性被認為是此波段的最佳層組合。目前鉬矽多層膜可得的反射率約在68~69%之間,仍低於理論值上74%的反射率,且與實際應用上所需要的70%還有差距。然而,以目前科技水準,要達到此目標是可以預期的。
本論文是以鉬矽多層膜高反鏡的研究作為主軸,主要可以分成製鍍與膜層分析兩部分。在製鍍部分,我們利用Spiller的設計理論,選擇適當的材料,並探討基板的準備與清潔,再以射頻離子束濺鍍方法製鍍鉬矽多層膜。在分析部分,我們利用硬X光(波長為1.54Å)反射率光譜先對單層膜作薄膜特性分析,並以優化方法得到最佳膜層參數。接著進入多層膜的分析,比較不同製鍍參數下的結果,並尋找整個多層膜製鍍中最適當的製鍍條件與參數。
摘要(英) Normal incidence multilayer mirrors are actually a key device to developing X-ray optics. Mo/Si multilayer is always the best choice for the soft X-ray wavelength(13.6nm). Calculations of the reflectivity at normal incidence of a Mo/Si stack predict a reflectivity of ~74%. However, the reflectivity of 68~69% obtained by some experimental groups are still below this value. In addition, to ensure practical application in X-ray Lithographic setups, the mirrors peak reflectivity should be no less 70%, which is feasible in the current state of technology.
We focuses on the research about Mo/Si stack X-ray mirrors in this paper. It consists of two main parts. We talk about the fabrication of the Mo/Si multilayer in the first part, including X-ray mirror design, substrate preparing and RF ion beam sputtering. In the second part, we have studied microstructure of Mo single layer by the X-ray reflectivity for wavelength 1.54 Å and make use of simplex method to find the best parameters of the film. Finally we compared and discussed the results of four samples with different conditions to choose an optimal deposition parameter.
關鍵字(中) ★ 鉬矽多層膜
★ X光多層膜
★ X光高反射鏡
關鍵字(英) ★ Soft X-ray
★ Sputter
★ GIXR
★ Mo/Si multilayer
★ X-ray mirror
論文目次 第 1 章 前 言 1
1-1 研究動機 1
1-2 論文概要 2
第 2 章 基本理論 3
2-1 單電子與多電子原子的散射 3
2-1-1 自由電子的散射 3
2-1-2 束縛電子的散射 6
2-1-3 多電子原子的散射 8
2-2 X光反射率 12
2-2-1 波動方程與折射率 12
2-2-2 單一界面的反射率 15
2-2-3 多個界面的反射率 16
2-3 簡形優化法 18
第 3 章 實驗儀器 21
3-1 射頻離子束濺鍍(RF Ion Beam Sputtering Deposition) 21
3-2 掠角入射X光反射儀 24
3-3 原子力顯微鏡(Atomic Force Microscope) 26
第 4 章 多層膜高反射鏡之製鍍 28
4-1 X光高反射鏡之膜層設計 28
4-1-1 多層膜高反射鏡之設計理論 28
4-1-2 適當材料的選擇 30
4-1-3 優化膜層厚度 31
4-2 多層膜之製鍍 33
4-3 基板的準備 35
第 5 章 實驗結果與分析 37
5-1 X光繞射儀量測分析 37
5-1-1 光強修正分析 37
5-1-2 薄膜特性分析 41
5-2 鉬單層膜分析 45
5-3 多層膜分析 51
5-3-1 個別多層膜分析 54
5-3-2 交叉分析 60
5-3-3 135 Å波段高反射鏡設計 64
第 6 章 結論 69
第 7 章 參考文獻 71
參考文獻 1. A. H. Compton and S. K. Allison, "X-rays in Theory and Experiment", van Nostrand, New York, 1935
2. A. V. Vinogradov, B. Ya. Zeldovich, "X-ray and far UV multilayer mirrors", Applied Optics, 16, pp.89-93, 1977
3. B. L. Henke, E. M. Gullikson, J. C. Davis, "X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50-30,000 eV,Z=1-92", Atomic data and nuclear data tables, 54, pp.181-342, 1993
4. Claude Montcalm, Brian T. Sullivan, Henri Pepin, J.A. Dobrowolski, and M. Sutton, "Extreme-ultraviolet Mo/Si multilayer mirrors deposited by radio-frequency-magnetron sputtering", Applied Optics, 33(10), pp.2057-2068, April 1994
5. David T. Attwood, "Soft x-rays and extreme ultraviolet radiation : principles and applications", Cambridge University Press, 2000
6. David L. Windt, "XUV optical constants of single-crystal GaAs and sputtered C, Si, Cr3C2, Mo and W", Appl. Optics, 30, pp. 15-25, 1991
7. D. E. Savage, N. Schimke, Y.-H. Phang, and M. G. Lagally, "Interfacial roughness correlation in multilayer films: Influence of total film and individual layer thicknesses", J. Appl. Phys., 71(7), pp.3283, 1989
8. David L. Windt, R. Hull, and W. K. Waskiewicz, "Interface Imperfections in Metal/Si X-Ray Multilayer Structures", OSA Proceedings on Soft-X-Ray Projection Lithography, Vol. 12,1991
9. E. Spiller, "Soft X-ray optics", SPIE Optical Engineering Press, Washington, 1994
10. E. Spiller, "Refractive index of amorphous carbon near its K-edge", Appl. Optics, 29, pp. 19-23, 1990
11. E. Spllier, "Low-loss reflection coating using absorbing materials", appl. Phys. Lett., 20(9), pp. 365, 1972
12. E. Spiller and A. E. Rosenbluth, "Determination of thickness errors and boundary roughness from the measured performance of multilayer coating", Opt. Eng., 25, p.p. 954-963, 1986
13. G.S. Lodha, V.K. Raghuvanshi, M.H. Modi, P. Tripathi, A. Verma, R.V. Nandekar, "X-ray multilayer optics: growth and characterization", Vacuum, 60, pp. 385-399, 2001
14. Harold R. Kaufman and Raymond S. Robinson, "Operation of broad-beam sources", Commonwealth Scientific Cooperation, Virginia, 1987
15. A. E. Yakshin, E. Louis, P.C. GÖrts, E.L.G. Maas, F. Bijkerk, "Determination of the layered structure in Mo/Si multilayer by grazing incidence X-ray reflectometry", Physica B, 283, pp. 143-148, 2000
16. J.D. Jackson, "Classical Electrodynamics", Wiley, New York, third Edition, 1998
17. John B. Dinklage, "X-ray diffraction by multilayered thin-film structures and their diffusion", J. Appl. Phys., 38, pp.3781, 1967
18. K. Yamashita, H. Tsunemi, S. Kitamoto, I. Hatsukade, Y. Ueno, M. Ohtani, "X-ray optical properties of molybdenum-carbon, molybdenum-silicon, and nickel-carbon multilayers", Rev. Sci. Instrum., 60(7), July 1989
19. Masahito NIIBE, Shigetaro OGURA, Masami TSUKAMOTO, Takashi IIZUKA, Akira MIYAKE, Yutaka WATANABE, Yasuaki FUKUDA, "Normal Incidence Multilayer Mirrors for Soft X-Rays", The Review of Laser Engineering, Vol.24, No.1, pp.48-60, 1996
20. Pierre Boher, Philippe Houdy, Claude Schiller, "Grazing X-ray reflecton analysis of nanometric scale structures", J. Appl. Phys., 68(12), pp. 6133-6142, 1990
21. J. H. Underwood, E. M. Gullikson, Khanh Nguyen, " Tarnishing of Mo/Si multilayer X-ray mirrors", Appl. Opt., 32(4), pp.6985, 1993
22. Shigehisa Ohki, Sunao Ishihara, "An Overview of X-Ray Lithography ", Microelectronic Engineering, 30, pp.171-178, 1996
23. S. S. Andreev, S. V. Gaponov, " The microstructure and X-ray reflectivity of Mo/Si multilayers", Thin Solid Films, 415, pp.123-132, 2002
24. William H. Press, Saul A. Teukolsky, William T. Vettering, Brain P. Flannery, "Numerical Recipes in C++ - the art of scientific computing," Cambridge University Press, second edition, 2002
25. Masaki Yamamoto, Takeshi Namioka, "Layer-by-layer design method for soft-x-ray multilayer", Appl. Opt., 31(10), pp.1622, 1992
26. Juan I. Larruquert, "New layer-by-layer design method", JOSA, Vol. 19, No. 2, Fabruary 2002
27. 李正中, "薄膜光學與鍍膜技術", 藝軒出版社, 第三版, 2002
28. 李信義, "X光反射綠於薄膜分析上之應用", 科儀新知, 22(2), pp. 39-46, 2000
29. 鄭光珮, "X光波域光學薄膜之研究", 國立中央大學光電科學研究所碩士論文, 2002
30. 汪建民, "材料分析", 1998, pp.76
指導教授 李正中(Cheng-Chung Lee) 審核日期 2003-7-7
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