The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing

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題名:	The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing
作者:	Fan,TH;Balakrishnan,N;Chang,CC
貢獻者:	統計研究所
關鍵詞:	DEGRADATION
日期:	2009
上傳時間:	2010-06-29 19:33:29 (UTC+8)
出版者:	中央大學
摘要:	Due to the high reliability and high testing cost of electro-explosive devices, even though an accelerated test is performed, one may observe very few failures or even no failures at all due to censoring. In this paper, we consider modelling the reliability of such devices by an exponential lifetime distribution in which the failure rate is assumed to be a function of some covariates and that the observed data are binary. The Bayesian approach, with three different prior settings, is used to develop inference on the failure rate, lifetime and the reliability under some settings. A Monte Carlo simulation study is carried out to show that this approach is quite useful and suitable for analysing data of the considered form, especially when the failure rates are very small. Finally, illustrative data are analysed using this approach.
關聯:	JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION
顯示於類別:	[統計研究所] 期刊論文

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