HIGHER-ORDER ANALYSIS OF 4-BEAM CROSS GRATING INTERFEROMETERS

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/28285

Title:	HIGHER-ORDER ANALYSIS OF 4-BEAM CROSS GRATING INTERFEROMETERS
Authors:	CHENG,YS
Contributors:	光電科學研究所
Keywords:	FRINGE FORMATION
Date:	1991
Issue Date:	2010-06-29 19:45:29 (UTC+8)
Publisher:	中央大學
Abstract:	Both on- and off-axis four-beam interference patterns are analyzed using ray tracing. The cross gratinglike interference pattern is accompanied by an extra term which consists of two orthogonal two-beam interference patterns. When partially coherent light is used, the extra term generally degrades the contrast of the cross gratinglike pattern unless some special kinds of source are utilized. With gratings of high spatial frequencies, the amplitude of the extra term can become large compared with the desired term. Consequently, the localized cross gratinglike pattern is changed to be periodic in different directions.
Relation:	APPLIED OPTICS
Appears in Collections:	[Graduate Institute of Optics and Photonics] journal & Dissertation

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