English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 78852/78852 (100%)
造訪人次 : 38473090      線上人數 : 2447
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/29302


    題名: Electrical and luminescent characteristics of alpha-SiC:H p-i-n thin-film LED's with graded-gap junctions
    作者: Jen,TS;Shin,NF;Laih,LH;Chen,YA;Hong,JW;Chang,CY
    貢獻者: 電機工程研究所
    關鍵詞: LIGHT-EMITTING-DIODES;AMORPHOUS-SILICON;INTERFACE;ELECTROLUMINESCENCE
    日期: 1997
    上傳時間: 2010-06-29 20:21:17 (UTC+8)
    出版者: 中央大學
    摘要: A-SiC:H p-i-n thin-film LED's (TFLED's) containing a single graded-gap p-i-n junction (SG) or double graded-gap p-i-n and i-n junctions (DG) have been postulated and fabricated successfully on indium-tin-oxide (ITO)-coated glass substrates, with a plasma-enhanced chemical vapor deposition (PECVD) system, Some important characteristics and related physics of these two types of TFLED's are presented and discussed, At an injection current density (J) of 600 mA/cm(2), the brightness (B) of the SG and DG TFLED's obtained were 30 and 207 cd/m(2), respectively, This significant improvement of brightness, as compared to those of the previously reported TFLED's with a highest brightness of 20 cd/m(2), could be ascribed to the reduced interface states with the graded-gap junctions, lower contact resistance between ITO and p-layer due to a plasma treatment of ITO prior to p-layer deposition, post metallization annealing of thermally evaporated Al on n-layer, and higher optical gaps (E(opt)'s) of the doped layers employed, The slopes of the nearly linear B-J relationships show the diode factor very close to unity for the fabricated SG and DG TFLED's, This implies that the electroluminescence (EL) mechanism of these TFLED's might be a tail-to-tail-state recombination, In addition, the conduction currents of these TFLED's are almost temperature dependent, and that of the DG TFLED might consist of an ohmic current and a space-charge-limited current (SCLC) within the lower and higher applied-bias regions, respectively.
    關聯: IEEE TRANSACTIONS ON ELECTRON DEVICES
    顯示於類別:[電機工程研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML556檢視/開啟


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明