On the development of CMM inspection technology for parts without regular features

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題名:	On the development of CMM inspection technology for parts without regular features
作者:	Lai,Jiing-Yih;Chen,Kuo-Jen
貢獻者:	機械工程研究所
關鍵詞:	LOCALIZATION;SURFACES;REGISTRATION
日期:	2007
上傳時間:	2010-07-06 16:20:54 (UTC+8)
出版者:	中央大學
摘要:	Many industrial parts are designed with freeform features only. Some may have regular features, but their shape may deform during the manufacturing process, resulting in no feature to act as the datum for inspection. The objective of this study is to prop
關聯:	JOURNAL OF THE CHINESE SOCIETY OF MECHANICAL ENGINEERS
顯示於類別:	[機械工程研究所] 期刊論文

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